Microelectronics manufacturing diagnostics handbook:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York
Van Nostrand Reinhold
1993
|
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XXXI, 633 S Ill., graph. Darst |
| ISBN: | 0442004710 |
Internformat
MARC
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| 005 | 20200914 | ||
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| 035 | |a (OCoLC)634555311 | ||
| 035 | |a (DE-599)GBV110089529 | ||
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| 245 | 1 | 0 | |a Microelectronics manufacturing diagnostics handbook |c ed. by Abraham H. Landzberg |
| 264 | 1 | |a New York |b Van Nostrand Reinhold |c 1993 | |
| 300 | |a XXXI, 633 S |b Ill., graph. Darst | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
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| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 653 | 0 | |a Electronic industries | |
| 653 | 0 | |a Semiconductors / Design and construction | |
| 653 | 0 | |a Production management / Quality control | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Landzberg, Abraham H. |d 1929- |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031577350 | ||
Datensatz im Suchindex
| _version_ | 1804180578102149120 |
|---|---|
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| building | Verbundindex |
| bvnumber | BV046198136 |
| callnumber-first | T - Technology |
| callnumber-label | TK7836 |
| callnumber-raw | TK7836 |
| callnumber-search | TK7836 |
| callnumber-sort | TK 47836 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4900 |
| ctrlnum | (OCoLC)634555311 (DE-599)GBV110089529 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV046198136 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:37:59Z |
| institution | BVB |
| isbn | 0442004710 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031577350 |
| oclc_num | 634555311 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XXXI, 633 S Ill., graph. Darst |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Van Nostrand Reinhold |
| record_format | marc |
| spelling | Microelectronics manufacturing diagnostics handbook ed. by Abraham H. Landzberg New York Van Nostrand Reinhold 1993 XXXI, 633 S Ill., graph. Darst txt rdacontent n rdamedia nc rdacarrier Literaturangaben Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Electronic industries Semiconductors / Design and construction Production management / Quality control Mikroelektronik (DE-588)4039207-7 s DE-604 Landzberg, Abraham H. 1929- Sonstige oth |
| spellingShingle | Microelectronics manufacturing diagnostics handbook Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4039207-7 |
| title | Microelectronics manufacturing diagnostics handbook |
| title_auth | Microelectronics manufacturing diagnostics handbook |
| title_exact_search | Microelectronics manufacturing diagnostics handbook |
| title_full | Microelectronics manufacturing diagnostics handbook ed. by Abraham H. Landzberg |
| title_fullStr | Microelectronics manufacturing diagnostics handbook ed. by Abraham H. Landzberg |
| title_full_unstemmed | Microelectronics manufacturing diagnostics handbook ed. by Abraham H. Landzberg |
| title_short | Microelectronics manufacturing diagnostics handbook |
| title_sort | microelectronics manufacturing diagnostics handbook |
| topic | Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Mikroelektronik |
| work_keys_str_mv | AT landzbergabrahamh microelectronicsmanufacturingdiagnosticshandbook |