APA-Zitierstil (7. Ausg.)

Celano, U. (2019). Electrical Atomic Force Microscopy for Nanoelectronics (1st ed. 2019.). Springer International Publishing. https://doi.org/10.1007/978-3-030-15612-1

Chicago-Zitierstil (17. Ausg.)

Celano, Umberto. Electrical Atomic Force Microscopy for Nanoelectronics. 1st ed. 2019. Cham: Springer International Publishing, 2019. https://doi.org/10.1007/978-3-030-15612-1.

MLA-Zitierstil (9. Ausg.)

Celano, Umberto. Electrical Atomic Force Microscopy for Nanoelectronics. 1st ed. 2019. Springer International Publishing, 2019. https://doi.org/10.1007/978-3-030-15612-1.