Electrical Atomic Force Microscopy for Nanoelectronics:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2019
Cham Springer |
| Ausgabe: | 1st ed. 2019 |
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Online-Zugang: | BTU01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XX, 408 p. 256 illus., 230 illus. in color) |
| ISBN: | 9783030156121 |
| ISSN: | 1434-4904 |
| DOI: | 10.1007/978-3-030-15612-1 |
Internformat
MARC
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| 650 | 4 | |a Nanoscale Science and Technology | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author2 | Celano, Umberto |
| author2_role | edt |
| author2_variant | u c uc |
| author_facet | Celano, Umberto |
| building | Verbundindex |
| bvnumber | BV046137565 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9783030156121 (OCoLC)1190472709 (DE-599)BVBBV046137565 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-030-15612-1 |
| edition | 1st ed. 2019 |
| format | Electronic eBook |
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| id | DE-604.BV046137565 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:36:13Z |
| institution | BVB |
| isbn | 9783030156121 |
| issn | 1434-4904 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031517865 |
| oclc_num | 1190472709 |
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| owner_facet | DE-634 DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (XX, 408 p. 256 illus., 230 illus. in color) |
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| publishDate | 2019 |
| publishDateSearch | 2019 |
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| publisher | Springer International Publishing Springer |
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| series2 | NanoScience and Technology |
| spelling | Electrical Atomic Force Microscopy for Nanoelectronics edited by Umberto Celano 1st ed. 2019 Cham Springer International Publishing 2019 Cham Springer 1 Online-Ressource (XX, 408 p. 256 illus., 230 illus. in color) txt rdacontent c rdamedia cr rdacarrier NanoScience and Technology 1434-4904 Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s Nanoelektronik (DE-588)4732034-5 s DE-604 Celano, Umberto edt Erscheint auch als Druck-Ausgabe 978-3-030-15611-4 Erscheint auch als Druck-Ausgabe 978-3-030-15613-8 Erscheint auch als Druck-Ausgabe 978-3-030-15614-5 https://doi.org/10.1007/978-3-030-15612-1 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Electrical Atomic Force Microscopy for Nanoelectronics Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4732034-5 (DE-588)4274473-8 |
| title | Electrical Atomic Force Microscopy for Nanoelectronics |
| title_auth | Electrical Atomic Force Microscopy for Nanoelectronics |
| title_exact_search | Electrical Atomic Force Microscopy for Nanoelectronics |
| title_full | Electrical Atomic Force Microscopy for Nanoelectronics edited by Umberto Celano |
| title_fullStr | Electrical Atomic Force Microscopy for Nanoelectronics edited by Umberto Celano |
| title_full_unstemmed | Electrical Atomic Force Microscopy for Nanoelectronics edited by Umberto Celano |
| title_short | Electrical Atomic Force Microscopy for Nanoelectronics |
| title_sort | electrical atomic force microscopy for nanoelectronics |
| topic | Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik (DE-588)4732034-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Spectroscopy and Microscopy Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Nanoscale Science and Technology Nanotechnology Surfaces (Physics) Electronics Optical materials Nanoelektronik Rasterkraftmikroskopie |
| url | https://doi.org/10.1007/978-3-030-15612-1 |
| work_keys_str_mv | AT celanoumberto electricalatomicforcemicroscopyfornanoelectronics |