VLSI design and test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers
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Bibliographic Details
Corporate Author: VDAT Indore (Author)
Other Authors: Sengupta, Anirban ca. 20./21. Jahrhundert (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor), Sharma, Rohit (Editor), Kumar Vishvakarma, Santosh (Editor)
Format: Electronic Conference Proceeding eBook
Language:English
Published: Singapore Springer [2019]
Series:Communications in Computer and Information Science 1066
Subjects:
Online Access:BTU01
FHA01
FHI01
FHM01
FHN01
FHR01
FKE01
FLA01
FRO01
FWS01
FWS02
HTW01
UBG01
UBM01
UBR01
UBT01
UBW01
UBY01
UER01
UPA01
Volltext
Physical Description:1 Online-Ressource (xvi, 775 Seiten) Illustrationen
ISBN:9789813297678
ISSN:1865-0929
DOI:10.1007/978-981-32-9767-8