Fundamental principles of engineering nanometrology:
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Oxford, OX
Elsevier, William Andrew
2014
|
| Ausgabe: | Second edition |
| Schriftenreihe: | Micro & nano technologies
|
| Schlagworte: | |
| Online-Zugang: | FLA01 Volltext |
| Zusammenfassung: | Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardiza |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 online resource (384 pages) |
| ISBN: | 9781455777501 1455777501 |
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Datensatz im Suchindex
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| author | Leach, R. K. |
| author_facet | Leach, R. K. |
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| dewey-full | 620.50287 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations 621 - Applied physics |
| dewey-raw | 620.50287 621.381 |
| dewey-search | 620.50287 621.381 |
| dewey-sort | 3620.50287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Second edition |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:35:54Z |
| institution | BVB |
| isbn | 9781455777501 1455777501 |
| language | English |
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| series2 | Micro & nano technologies |
| spelling | Leach, R. K. Verfasser aut Fundamental principles of engineering nanometrology Richard Leach Second edition Oxford, OX Elsevier, William Andrew 2014 1 online resource (384 pages) txt rdacontent c rdamedia cr rdacarrier Micro & nano technologies Includes bibliographical references and index Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardiza TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Metrology fast Microtechnology fast Nanotechnology fast Nanotechnology Microtechnology Metrology Metrologie (DE-588)4169749-2 gnd rswk-swf Nanotechnologie (DE-588)4327470-5 gnd rswk-swf Nanostruktur (DE-588)4204530-7 gnd rswk-swf Nanostruktur (DE-588)4204530-7 s Nanotechnologie (DE-588)4327470-5 s Metrologie (DE-588)4169749-2 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 1455777536 Erscheint auch als Druck-Ausgabe 9781455777532 http://www.sciencedirect.com/science/book/9781455777532 Verlag URL des Erstveröffentlichers Volltext text file 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Leach, R. K. Fundamental principles of engineering nanometrology TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Metrology fast Microtechnology fast Nanotechnology fast Nanotechnology Microtechnology Metrology Metrologie (DE-588)4169749-2 gnd Nanotechnologie (DE-588)4327470-5 gnd Nanostruktur (DE-588)4204530-7 gnd |
| subject_GND | (DE-588)4169749-2 (DE-588)4327470-5 (DE-588)4204530-7 |
| title | Fundamental principles of engineering nanometrology |
| title_auth | Fundamental principles of engineering nanometrology |
| title_exact_search | Fundamental principles of engineering nanometrology |
| title_full | Fundamental principles of engineering nanometrology Richard Leach |
| title_fullStr | Fundamental principles of engineering nanometrology Richard Leach |
| title_full_unstemmed | Fundamental principles of engineering nanometrology Richard Leach |
| title_short | Fundamental principles of engineering nanometrology |
| title_sort | fundamental principles of engineering nanometrology |
| topic | TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Metrology fast Microtechnology fast Nanotechnology fast Nanotechnology Microtechnology Metrology Metrologie (DE-588)4169749-2 gnd Nanotechnologie (DE-588)4327470-5 gnd Nanostruktur (DE-588)4204530-7 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Engineering (General) TECHNOLOGY & ENGINEERING / Reference Metrology Microtechnology Nanotechnology Metrologie Nanotechnologie Nanostruktur |
| url | http://www.sciencedirect.com/science/book/9781455777532 |
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