Trap level spectroscopy in amorphous semiconductors:
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscop...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Elsevier
2010
|
| Schriftenreihe: | Elsevier insights
|
| Schlagworte: | |
| Online-Zugang: | FLA01 Volltext |
| Zusammenfassung: | Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique |
| Beschreibung: | Includes bibliographical references |
| Beschreibung: | 1 online resource |
| ISBN: | 9780123847157 012384715X |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV046125492 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 190827s2010 |||| o||u| ||||||eng d | ||
| 015 | |a GBB045319 |2 dnb | ||
| 020 | |a 9780123847157 |9 978-0-12-384715-7 | ||
| 020 | |a 012384715X |9 0-12-384715-X | ||
| 035 | |a (ZDB-33-ESD)ocn647765364 | ||
| 035 | |a (OCoLC)647765364 | ||
| 035 | |a (DE-599)BVBBV046125492 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 537.6223 |2 22 | |
| 100 | 1 | |a Mikla, Victor I. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Trap level spectroscopy in amorphous semiconductors |c Viktor I. Mikla |
| 264 | 1 | |a Oxford |b Elsevier |c 2010 | |
| 300 | |a 1 online resource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Elsevier insights | |
| 500 | |a Includes bibliographical references | ||
| 520 | |a Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique | ||
| 650 | 7 | |a Deep level transient spectroscopy |2 fast | |
| 650 | 4 | |a Amorphous semiconductors |x Spectra | |
| 650 | 4 | |a Amorphous semiconductors |x Defects |x Analysis | |
| 650 | 4 | |a Deep level transient spectroscopy | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780123847157 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031505946 | ||
| 966 | e | |u http://www.sciencedirect.com/science/book/9780123847157 |l FLA01 |p ZDB-33-ESD |q FLA_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804180444675047424 |
|---|---|
| any_adam_object | |
| author | Mikla, Victor I. |
| author_facet | Mikla, Victor I. |
| author_role | aut |
| author_sort | Mikla, Victor I. |
| author_variant | v i m vi vim |
| building | Verbundindex |
| bvnumber | BV046125492 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocn647765364 (OCoLC)647765364 (DE-599)BVBBV046125492 |
| dewey-full | 537.6223 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6223 |
| dewey-search | 537.6223 |
| dewey-sort | 3537.6223 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01809nmm a2200409zc 4500</leader><controlfield tag="001">BV046125492</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">190827s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBB045319</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780123847157</subfield><subfield code="9">978-0-12-384715-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">012384715X</subfield><subfield code="9">0-12-384715-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn647765364</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)647765364</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046125492</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.6223</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Mikla, Victor I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Trap level spectroscopy in amorphous semiconductors</subfield><subfield code="c">Viktor I. Mikla</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Elsevier insights</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Deep level transient spectroscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Amorphous semiconductors</subfield><subfield code="x">Spectra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Amorphous semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="x">Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Deep level transient spectroscopy</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780123847157</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031505946</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/book/9780123847157</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FLA_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046125492 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:35:52Z |
| institution | BVB |
| isbn | 9780123847157 012384715X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031505946 |
| oclc_num | 647765364 |
| open_access_boolean | |
| physical | 1 online resource |
| psigel | ZDB-33-ESD ZDB-33-ESD FLA_PDA_ESD |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Elsevier insights |
| spelling | Mikla, Victor I. Verfasser aut Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla Oxford Elsevier 2010 1 online resource txt rdacontent c rdamedia cr rdacarrier Elsevier insights Includes bibliographical references Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique Deep level transient spectroscopy fast Amorphous semiconductors Spectra Amorphous semiconductors Defects Analysis Deep level transient spectroscopy http://www.sciencedirect.com/science/book/9780123847157 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Mikla, Victor I. Trap level spectroscopy in amorphous semiconductors Deep level transient spectroscopy fast Amorphous semiconductors Spectra Amorphous semiconductors Defects Analysis Deep level transient spectroscopy |
| title | Trap level spectroscopy in amorphous semiconductors |
| title_auth | Trap level spectroscopy in amorphous semiconductors |
| title_exact_search | Trap level spectroscopy in amorphous semiconductors |
| title_full | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla |
| title_fullStr | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla |
| title_full_unstemmed | Trap level spectroscopy in amorphous semiconductors Viktor I. Mikla |
| title_short | Trap level spectroscopy in amorphous semiconductors |
| title_sort | trap level spectroscopy in amorphous semiconductors |
| topic | Deep level transient spectroscopy fast Amorphous semiconductors Spectra Amorphous semiconductors Defects Analysis Deep level transient spectroscopy |
| topic_facet | Deep level transient spectroscopy Amorphous semiconductors Spectra Amorphous semiconductors Defects Analysis |
| url | http://www.sciencedirect.com/science/book/9780123847157 |
| work_keys_str_mv | AT miklavictori traplevelspectroscopyinamorphoussemiconductors |