Architecture design for soft errors:
This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam Boston
Morgan Kaufmann Publishers/Elsevier
© 2008
|
| Schlagworte: | |
| Online-Zugang: | FLA01 Volltext |
| Zusammenfassung: | This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 online resource (xxi, 337 pages) illustrations |
| ISBN: | 9780123695291 0123695295 9780080558325 0080558321 |
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Datensatz im Suchindex
| _version_ | 1804180443299315712 |
|---|---|
| any_adam_object | |
| author | Mukherjee, Shubu |
| author_facet | Mukherjee, Shubu |
| author_role | aut |
| author_sort | Mukherjee, Shubu |
| author_variant | s m sm |
| building | Verbundindex |
| bvnumber | BV046124849 |
| collection | ZDB-33-ESD |
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| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV046124849 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:35:50Z |
| institution | BVB |
| isbn | 9780123695291 0123695295 9780080558325 0080558321 |
| language | English |
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| physical | 1 online resource (xxi, 337 pages) illustrations |
| psigel | ZDB-33-ESD ZDB-33-ESD FLA_PDA_ESD |
| publishDate | 2008 |
| publishDateSearch | 2008 |
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| publisher | Morgan Kaufmann Publishers/Elsevier |
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| spelling | Mukherjee, Shubu Verfasser aut Architecture design for soft errors Shubu Mukherjee Amsterdam Boston Morgan Kaufmann Publishers/Elsevier © 2008 1 online resource (xxi, 337 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them Systèmes informatiques / Fiabilité Ordinateurs / Fiabilité Logiciels / Évaluation Circuits intégrés, Effets du rayonnement sur les Logiciels / Fiabilité Circuits intégrés / Tolérance aux fautes Tolérance aux fautes (Informatique) TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Computer architecture fast Integrated circuits fast Integrated circuits / Effect of radiation on fast System design fast Fehler gnd Halbleiterspeicher gnd Integrierte Schaltung gnd Softwarearchitektur gnd Softwarewartung gnd Electronic books Integrated circuits Integrated circuits Effect of radiation on Computer architecture System design Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Fehler (DE-588)4016606-5 gnd rswk-swf Softwarearchitektur (DE-588)4121677-5 gnd rswk-swf Softwarewartung (DE-588)4197459-1 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 gnd rswk-swf Softwarearchitektur (DE-588)4121677-5 s Integrierte Schaltung (DE-588)4027242-4 s Softwarewartung (DE-588)4197459-1 s Halbleiterspeicher (DE-588)4120419-0 s Fehler (DE-588)4016606-5 s 1\p DE-604 http://www.sciencedirect.com/science/book/9780123695291 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Mukherjee, Shubu Architecture design for soft errors Systèmes informatiques / Fiabilité Ordinateurs / Fiabilité Logiciels / Évaluation Circuits intégrés, Effets du rayonnement sur les Logiciels / Fiabilité Circuits intégrés / Tolérance aux fautes Tolérance aux fautes (Informatique) TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Computer architecture fast Integrated circuits fast Integrated circuits / Effect of radiation on fast System design fast Fehler gnd Halbleiterspeicher gnd Integrierte Schaltung gnd Softwarearchitektur gnd Softwarewartung gnd Electronic books Integrated circuits Integrated circuits Effect of radiation on Computer architecture System design Integrierte Schaltung (DE-588)4027242-4 gnd Fehler (DE-588)4016606-5 gnd Softwarearchitektur (DE-588)4121677-5 gnd Softwarewartung (DE-588)4197459-1 gnd Halbleiterspeicher (DE-588)4120419-0 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4016606-5 (DE-588)4121677-5 (DE-588)4197459-1 (DE-588)4120419-0 |
| title | Architecture design for soft errors |
| title_auth | Architecture design for soft errors |
| title_exact_search | Architecture design for soft errors |
| title_full | Architecture design for soft errors Shubu Mukherjee |
| title_fullStr | Architecture design for soft errors Shubu Mukherjee |
| title_full_unstemmed | Architecture design for soft errors Shubu Mukherjee |
| title_short | Architecture design for soft errors |
| title_sort | architecture design for soft errors |
| topic | Systèmes informatiques / Fiabilité Ordinateurs / Fiabilité Logiciels / Évaluation Circuits intégrés, Effets du rayonnement sur les Logiciels / Fiabilité Circuits intégrés / Tolérance aux fautes Tolérance aux fautes (Informatique) TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Computer architecture fast Integrated circuits fast Integrated circuits / Effect of radiation on fast System design fast Fehler gnd Halbleiterspeicher gnd Integrierte Schaltung gnd Softwarearchitektur gnd Softwarewartung gnd Electronic books Integrated circuits Integrated circuits Effect of radiation on Computer architecture System design Integrierte Schaltung (DE-588)4027242-4 gnd Fehler (DE-588)4016606-5 gnd Softwarearchitektur (DE-588)4121677-5 gnd Softwarewartung (DE-588)4197459-1 gnd Halbleiterspeicher (DE-588)4120419-0 gnd |
| topic_facet | Systèmes informatiques / Fiabilité Ordinateurs / Fiabilité Logiciels / Évaluation Circuits intégrés, Effets du rayonnement sur les Logiciels / Fiabilité Circuits intégrés / Tolérance aux fautes Tolérance aux fautes (Informatique) TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Computer architecture Integrated circuits Integrated circuits / Effect of radiation on System design Fehler Halbleiterspeicher Integrierte Schaltung Softwarearchitektur Softwarewartung Electronic books Integrated circuits Effect of radiation on |
| url | http://www.sciencedirect.com/science/book/9780123695291 |
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