Waveguide spectroscopy of thin films:

In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in t...

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Bibliographic Details
Main Author: Khomchenko, Alexander V. (Author)
Format: Electronic eBook
Language:English
Published: Amsterdam Elsevier 2005
Edition:1st ed
Series:Thin films and nanostructures v. 33
Subjects:
Online Access:FLA01
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Summary:In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated
Item Description:Includes bibliographical references (pages 207-217) and index
Physical Description:1 online resource (xv, 220 pages) illustrations
ISBN:9780120885152
0120885158
0080457894
9780080457895

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