Waveguide spectroscopy of thin films:
In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in t...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier
2005
|
| Ausgabe: | 1st ed |
| Schriftenreihe: | Thin films and nanostructures
v. 33 |
| Schlagworte: | |
| Online-Zugang: | FLA01 URL des Erstveröffentlichers URL des Erstveröffentlichers |
| Zusammenfassung: | In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated |
| Beschreibung: | Includes bibliographical references (pages 207-217) and index |
| Beschreibung: | 1 online resource (xv, 220 pages) illustrations |
| ISBN: | 9780120885152 0120885158 0080457894 9780080457895 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV046123367 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 190827s2005 |||| o||u| ||||||eng d | ||
| 020 | |a 9780120885152 |9 978-0-12-088515-2 | ||
| 020 | |a 0120885158 |9 0-12-088515-8 | ||
| 020 | |a 0080457894 |9 0-08-045789-4 | ||
| 020 | |a 9780080457895 |9 978-0-08-045789-5 | ||
| 035 | |a (ZDB-33-ESD)ocn162130215 | ||
| 035 | |a (OCoLC)162130215 | ||
| 035 | |a (DE-599)BVBBV046123367 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 530.4/175 |2 22 | |
| 100 | 1 | |a Khomchenko, Alexander V. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Waveguide spectroscopy of thin films |c Alexander V. Khomchenko |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Amsterdam |b Elsevier |c 2005 | |
| 300 | |a 1 online resource (xv, 220 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Thin films and nanostructures |v v. 33 | |
| 500 | |a Includes bibliographical references (pages 207-217) and index | ||
| 520 | |a In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated | ||
| 650 | 4 | |a Couches minces / Spectre | |
| 650 | 4 | |a Couches minces / Propriétés optiques | |
| 650 | 7 | |a SCIENCE / Physics / Condensed Matter |2 bisacsh | |
| 650 | 7 | |a Thin films / Optical properties |2 fast | |
| 650 | 7 | |a Thin films / Spectra |2 fast | |
| 650 | 4 | |a Thin films |x Spectra | |
| 650 | 4 | |a Thin films |x Optical properties | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780120885152 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/15435016/33 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031503820 | ||
| 966 | e | |u http://www.sciencedirect.com/science/book/9780120885152 |l FLA01 |p ZDB-33-ESD |q FLA_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804180440186093568 |
|---|---|
| any_adam_object | |
| author | Khomchenko, Alexander V. |
| author_facet | Khomchenko, Alexander V. |
| author_role | aut |
| author_sort | Khomchenko, Alexander V. |
| author_variant | a v k av avk |
| building | Verbundindex |
| bvnumber | BV046123367 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocn162130215 (OCoLC)162130215 (DE-599)BVBBV046123367 |
| dewey-full | 530.4/175 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.4/175 |
| dewey-search | 530.4/175 |
| dewey-sort | 3530.4 3175 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 1st ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02554nmm a2200481zcb4500</leader><controlfield tag="001">BV046123367</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">190827s2005 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780120885152</subfield><subfield code="9">978-0-12-088515-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0120885158</subfield><subfield code="9">0-12-088515-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080457894</subfield><subfield code="9">0-08-045789-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080457895</subfield><subfield code="9">978-0-08-045789-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn162130215</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)162130215</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046123367</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.4/175</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Khomchenko, Alexander V.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Waveguide spectroscopy of thin films</subfield><subfield code="c">Alexander V. Khomchenko</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xv, 220 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Thin films and nanostructures</subfield><subfield code="v">v. 33</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (pages 207-217) and index</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Couches minces / Spectre</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Couches minces / Propriétés optiques</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Condensed Matter</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films / Optical properties</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films / Spectra</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield><subfield code="x">Spectra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield><subfield code="x">Optical properties</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780120885152</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/15435016/33</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031503820</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/book/9780120885152</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FLA_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046123367 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:35:47Z |
| institution | BVB |
| isbn | 9780120885152 0120885158 0080457894 9780080457895 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031503820 |
| oclc_num | 162130215 |
| open_access_boolean | |
| physical | 1 online resource (xv, 220 pages) illustrations |
| psigel | ZDB-33-ESD ZDB-33-ESD FLA_PDA_ESD |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Thin films and nanostructures |
| spelling | Khomchenko, Alexander V. Verfasser aut Waveguide spectroscopy of thin films Alexander V. Khomchenko 1st ed Amsterdam Elsevier 2005 1 online resource (xv, 220 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Thin films and nanostructures v. 33 Includes bibliographical references (pages 207-217) and index In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated Couches minces / Spectre Couches minces / Propriétés optiques SCIENCE / Physics / Condensed Matter bisacsh Thin films / Optical properties fast Thin films / Spectra fast Thin films Spectra Thin films Optical properties http://www.sciencedirect.com/science/book/9780120885152 Verlag URL des Erstveröffentlichers Volltext http://www.sciencedirect.com/science/bookseries/15435016/33 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Khomchenko, Alexander V. Waveguide spectroscopy of thin films Couches minces / Spectre Couches minces / Propriétés optiques SCIENCE / Physics / Condensed Matter bisacsh Thin films / Optical properties fast Thin films / Spectra fast Thin films Spectra Thin films Optical properties |
| title | Waveguide spectroscopy of thin films |
| title_auth | Waveguide spectroscopy of thin films |
| title_exact_search | Waveguide spectroscopy of thin films |
| title_full | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
| title_fullStr | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
| title_full_unstemmed | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
| title_short | Waveguide spectroscopy of thin films |
| title_sort | waveguide spectroscopy of thin films |
| topic | Couches minces / Spectre Couches minces / Propriétés optiques SCIENCE / Physics / Condensed Matter bisacsh Thin films / Optical properties fast Thin films / Spectra fast Thin films Spectra Thin films Optical properties |
| topic_facet | Couches minces / Spectre Couches minces / Propriétés optiques SCIENCE / Physics / Condensed Matter Thin films / Optical properties Thin films / Spectra Thin films Spectra Thin films Optical properties |
| url | http://www.sciencedirect.com/science/book/9780120885152 http://www.sciencedirect.com/science/bookseries/15435016/33 |
| work_keys_str_mv | AT khomchenkoalexanderv waveguidespectroscopyofthinfilms |