Electron microscopy and analysis:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boca Raton
CRC Press, Taylor & Francis Group
2017
|
| Edition: | Third edition |
| Subjects: | |
| Item Description: | Online resource; title from PDF title page (EBSCO, viewed May 18, 2018) |
| Physical Description: | 1 online resource illustrations |
| ISBN: | 9781420017250 142001725X |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV046098053 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 190812s2017 |||| o||u| ||||||eng d | ||
| 020 | |a 9781420017250 |9 978-1-4200-1725-0 | ||
| 020 | |a 142001725X |9 1-4200-1725-X | ||
| 035 | |a (ZDB-4-ENC)on1035158181 | ||
| 035 | |a (OCoLC)1035158181 | ||
| 035 | |a (DE-599)BVBBV046098053 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 502/.8/25 |2 21 | |
| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew, John Humphreys, Richard Beanland |
| 250 | |a Third edition | ||
| 264 | 1 | |a Boca Raton |b CRC Press, Taylor & Francis Group |c 2017 | |
| 300 | |a 1 online resource |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Online resource; title from PDF title page (EBSCO, viewed May 18, 2018) | ||
| 650 | 7 | |a SCIENCE / General |2 bisacsh | |
| 650 | 7 | |a Electron microscopy |2 fast | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Humphreys, F. J. |e Sonstige |4 oth | |
| 700 | 1 | |a Beanland, R. |e Sonstige |4 oth | |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031478875 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804180402996248576 |
|---|---|
| any_adam_object | |
| author | Goodhew, Peter J. |
| author_facet | Goodhew, Peter J. |
| author_role | aut |
| author_sort | Goodhew, Peter J. |
| author_variant | p j g pj pjg |
| building | Verbundindex |
| bvnumber | BV046098053 |
| collection | ZDB-4-ENC |
| ctrlnum | (ZDB-4-ENC)on1035158181 (OCoLC)1035158181 (DE-599)BVBBV046098053 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | Third edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01480nmm a2200421zc 4500</leader><controlfield tag="001">BV046098053</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">190812s2017 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781420017250</subfield><subfield code="9">978-1-4200-1725-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">142001725X</subfield><subfield code="9">1-4200-1725-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)on1035158181</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1035158181</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046098053</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">21</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Goodhew, Peter J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron microscopy and analysis</subfield><subfield code="c">Peter J. Goodhew, John Humphreys, Richard Beanland</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Third edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton</subfield><subfield code="b">CRC Press, Taylor & Francis Group</subfield><subfield code="c">2017</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Online resource; title from PDF title page (EBSCO, viewed May 18, 2018)</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Humphreys, F. J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Beanland, R.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031478875</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV046098053 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:35:12Z |
| institution | BVB |
| isbn | 9781420017250 142001725X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031478875 |
| oclc_num | 1035158181 |
| open_access_boolean | |
| physical | 1 online resource illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | CRC Press, Taylor & Francis Group |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland Third edition Boca Raton CRC Press, Taylor & Francis Group 2017 1 online resource illustrations txt rdacontent c rdamedia cr rdacarrier Online resource; title from PDF title page (EBSCO, viewed May 18, 2018) SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Humphreys, F. J. Sonstige oth Beanland, R. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goodhew, Peter J. Electron microscopy and analysis SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | SCIENCE / General Electron microscopy Elektronenmikroskopie |
| work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT humphreysfj electronmicroscopyandanalysis AT beanlandr electronmicroscopyandanalysis |