Electron microscopy and analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton
CRC Press, Taylor & Francis Group
2017
|
| Ausgabe: | Third edition |
| Schlagworte: | |
| Beschreibung: | Online resource; title from PDF title page (EBSCO, viewed May 18, 2018) |
| Beschreibung: | 1 online resource illustrations |
| ISBN: | 9781420017250 142001725X |
Internformat
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Goodhew, Peter J. |
| author_facet | Goodhew, Peter J. |
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| building | Verbundindex |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
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| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | Third edition |
| format | Electronic eBook |
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| id | DE-604.BV046098053 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:35:12Z |
| institution | BVB |
| isbn | 9781420017250 142001725X |
| language | English |
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| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | CRC Press, Taylor & Francis Group |
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| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland Third edition Boca Raton CRC Press, Taylor & Francis Group 2017 1 online resource illustrations txt rdacontent c rdamedia cr rdacarrier Online resource; title from PDF title page (EBSCO, viewed May 18, 2018) SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Humphreys, F. J. Sonstige oth Beanland, R. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goodhew, Peter J. Electron microscopy and analysis SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | SCIENCE / General bisacsh Electron microscopy fast Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | SCIENCE / General Electron microscopy Elektronenmikroskopie |
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