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Metrology:

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Bibliographic Details
Other Authors:	Gao, Wei (Editor)
Format:	Electronic eBook
Language:	English
Published:	Singapore Springer Singapore 2019- Singapore Springer
Edition:	Living reference work, continuously updated edition
Series:	Precision Manufacturing
Subjects:	Manufacturing, Machines, Tools, Processes Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Manufactures Surfaces (Physics) Engineering
Online Access:	BTU01 FAW01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 Volltext
Physical Description:	1 Online-Ressource (X, 616 p)
ISBN:	9789811049125
ISSN:	2522-5464
DOI:	10.1007/978-981-10-4912-5

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MARC


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Record in the Search Index

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id	DE-604.BV046062208
illustrated	Not Illustrated
indexdate	2025-02-20T06:58:33Z
institution	BVB
isbn	9789811049125
issn	2522-5464
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-031443523
oclc_num	1111820478
open_access_boolean
owner	DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 DE-1050
owner_facet	DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 DE-1050
physical	1 Online-Ressource (X, 616 p)
psigel	ZDB-2-ENG ZDB-2-SLR ZDB-2-ENG_2020 ZDB-2-ENG TUM_LRW
publishDate	2019
publishDateSearch	2019
publishDateSort	2019
publisher	Springer Singapore Springer
record_format	marc
series2	Precision Manufacturing
spellingShingle	Metrology Manufacturing, Machines, Tools, Processes Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Manufactures Surfaces (Physics) Engineering
title	Metrology
title_auth	Metrology
title_exact_search	Metrology
title_full	Metrology edited by Wei Gao
title_fullStr	Metrology edited by Wei Gao
title_full_unstemmed	Metrology edited by Wei Gao
title_short	Metrology
title_sort	metrology
topic	Manufacturing, Machines, Tools, Processes Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Manufactures Surfaces (Physics) Engineering
topic_facet	Manufacturing, Machines, Tools, Processes Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Manufactures Surfaces (Physics) Engineering
url	https://doi.org/10.1007/978-981-10-4912-5
work_keys_str_mv	AT gaowei metrology

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