Advanced Real Time Imaging II: Cutting-Edge Techniques in Materials Science Studies
Gespeichert in:
| Weitere Verfasser: | , , , , , , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2019
Cham Springer |
| Schriftenreihe: | The Minerals, Metals & Materials Series
|
| Schlagworte: | |
| Online-Zugang: | BTU01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XII, 154 p. 86 illus., 54 illus. in color) |
| ISBN: | 9783030061432 |
| ISSN: | 2367-1181 |
| DOI: | 10.1007/978-3-030-06143-2 |
Internformat
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| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Materials Engineering | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Optics, Lasers, Photonics, Optical Devices | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Optical materials | |
| 700 | 1 | |a Nakano, Jinichiro |4 edt | |
| 700 | 1 | |a Pistorius, P. Chris |4 edt | |
| 700 | 1 | |a Tamerler, Candan |4 edt | |
| 700 | 1 | |a Yasuda, Hideyuki |4 edt | |
| 700 | 1 | |a Zhang, Zuotai |4 edt | |
| 700 | 1 | |a Dogan, Neslihan |4 edt | |
| 700 | 1 | |a Wang, Wanlin |4 edt | |
| 700 | 1 | |a Saito, Noritaka |4 edt | |
| 700 | 1 | |a Webler, Bryan |4 edt | |
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Datensatz im Suchindex
| _version_ | 1804180155966423040 |
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| any_adam_object | |
| author2 | Nakano, Jinichiro Pistorius, P. Chris Tamerler, Candan Yasuda, Hideyuki Zhang, Zuotai Dogan, Neslihan Wang, Wanlin Saito, Noritaka Webler, Bryan |
| author2_role | edt edt edt edt edt edt edt edt edt |
| author2_variant | j n jn p c p pc pcp c t ct h y hy z z zz n d nd w w ww n s ns b w bw |
| author_facet | Nakano, Jinichiro Pistorius, P. Chris Tamerler, Candan Yasuda, Hideyuki Zhang, Zuotai Dogan, Neslihan Wang, Wanlin Saito, Noritaka Webler, Bryan |
| building | Verbundindex |
| bvnumber | BV045948413 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9783030061432 (OCoLC)1107359200 (DE-599)BVBBV045948413 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie |
| doi_str_mv | 10.1007/978-3-030-06143-2 |
| format | Electronic eBook |
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| id | DE-604.BV045948413 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:31:16Z |
| institution | BVB |
| isbn | 9783030061432 |
| issn | 2367-1181 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031330544 |
| oclc_num | 1107359200 |
| open_access_boolean | |
| owner | DE-634 DE-91 DE-BY-TUM |
| owner_facet | DE-634 DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (XII, 154 p. 86 illus., 54 illus. in color) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2019 |
| publishDate | 2019 |
| publishDateSearch | 2019 |
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| publisher | Springer International Publishing Springer |
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| series2 | The Minerals, Metals & Materials Series |
| spelling | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies edited by Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, Bryan Webler Cham Springer International Publishing 2019 Cham Springer 1 Online-Ressource (XII, 154 p. 86 illus., 54 illus. in color) txt rdacontent c rdamedia cr rdacarrier The Minerals, Metals & Materials Series 2367-1181 Characterization and Evaluation of Materials Materials Engineering Optical and Electronic Materials Optics, Lasers, Photonics, Optical Devices Spectroscopy and Microscopy Surfaces (Physics) Optical materials Nakano, Jinichiro edt Pistorius, P. Chris edt Tamerler, Candan edt Yasuda, Hideyuki edt Zhang, Zuotai edt Dogan, Neslihan edt Wang, Wanlin edt Saito, Noritaka edt Webler, Bryan edt Erscheint auch als Druck-Ausgabe 978-3-030-06142-5 Erscheint auch als Druck-Ausgabe 978-3-030-06144-9 https://doi.org/10.1007/978-3-030-06143-2 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies Characterization and Evaluation of Materials Materials Engineering Optical and Electronic Materials Optics, Lasers, Photonics, Optical Devices Spectroscopy and Microscopy Surfaces (Physics) Optical materials |
| title | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies |
| title_auth | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies |
| title_exact_search | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies |
| title_full | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies edited by Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, Bryan Webler |
| title_fullStr | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies edited by Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, Bryan Webler |
| title_full_unstemmed | Advanced Real Time Imaging II Cutting-Edge Techniques in Materials Science Studies edited by Jinichiro Nakano, P Chris Pistorius, Candan Tamerler, Hideyuki Yasuda, Zuotai Zhang, Neslihan Dogan, Wanlin Wang, Noritaka Saito, Bryan Webler |
| title_short | Advanced Real Time Imaging II |
| title_sort | advanced real time imaging ii cutting edge techniques in materials science studies |
| title_sub | Cutting-Edge Techniques in Materials Science Studies |
| topic | Characterization and Evaluation of Materials Materials Engineering Optical and Electronic Materials Optics, Lasers, Photonics, Optical Devices Spectroscopy and Microscopy Surfaces (Physics) Optical materials |
| topic_facet | Characterization and Evaluation of Materials Materials Engineering Optical and Electronic Materials Optics, Lasers, Photonics, Optical Devices Spectroscopy and Microscopy Surfaces (Physics) Optical materials |
| url | https://doi.org/10.1007/978-3-030-06143-2 |
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