Holdings: Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films

Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films:

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Bibliographic Details
Main Author:	Duren, Stephan van (Author)
Format:	Thesis Electronic eBook
Language:	English
Published:	Berlin Universitätsverlag der TU Berlin 2019
Series:	Advanced ceramic materials 2
Subjects:	Schichtwachstum Solarzelle Reflektometrie Dünne Schicht Kesterit Röntgendiffraktometrie Raman-Spektroskopie Halbleiterschicht Prozessüberwachung Zerstörungsfreie Werkstoffprüfung PNK In situ Prozesskontrolle Optik annealing in situ process control kesterite optics phase evolution Hochschulschrift
Online Access:	Volltext
Physical Description:	1 Online-Ressource (xix, 183 Seiten) Illustrationen, Diagramme
ISBN:	9783798330658
DOI:	10.14279/depositonce-7732

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Record in the Search Index

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spelling	Duren, Stephan van Verfasser (DE-588)1187870137 aut Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren 201906 Berlin Universitätsverlag der TU Berlin 2019 1 Online-Ressource (xix, 183 Seiten) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier Advanced ceramic materials 2 Dissertation Technische Universität Berlin 2018 Schichtwachstum (DE-588)4273432-0 gnd rswk-swf Solarzelle (DE-588)4181740-0 gnd rswk-swf Reflektometrie (DE-588)4296759-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Kesterit (DE-588)4642407-6 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Raman-Spektroskopie (DE-588)4176916-8 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Prozessüberwachung (DE-588)4133922-8 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf PNK In situ Prozesskontrolle Kesterit Optik annealing in situ process control kesterite optics phase evolution (DE-588)4113937-9 Hochschulschrift gnd-content Kesterit (DE-588)4642407-6 s Dünne Schicht (DE-588)4136925-7 s Solarzelle (DE-588)4181740-0 s Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Prozessüberwachung (DE-588)4133922-8 s Raman-Spektroskopie (DE-588)4176916-8 s Röntgendiffraktometrie (DE-588)4336833-5 s Reflektometrie (DE-588)4296759-4 s DE-604 Halbleiterschicht (DE-588)4158812-5 s Schichtwachstum (DE-588)4273432-0 s 1\p DE-604 Technische Universität Berlin Universitätsbibliothek (DE-588)5053182-7 pbl Erscheint auch als Druck-Ausgabe 978-3-7983-3064-1 (DE-604)BV045912890 Advanced ceramic materials 2 (DE-604)BV045103058 2 https://doi.org/10.14279/depositonce-7732 Resolving-System kostenfrei Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Duren, Stephan van Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Advanced ceramic materials Schichtwachstum (DE-588)4273432-0 gnd Solarzelle (DE-588)4181740-0 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Kesterit (DE-588)4642407-6 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Halbleiterschicht (DE-588)4158812-5 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd
subject_GND	(DE-588)4273432-0 (DE-588)4181740-0 (DE-588)4296759-4 (DE-588)4136925-7 (DE-588)4642407-6 (DE-588)4336833-5 (DE-588)4176916-8 (DE-588)4158812-5 (DE-588)4133922-8 (DE-588)4067689-4 (DE-588)4113937-9
title	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films
title_auth	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films
title_exact_search	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films
title_full	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren
title_fullStr	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren
title_full_unstemmed	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren
title_short	Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films
title_sort	development of in situ methods for process monitoring and control and characterization of cu zn sn s based thin films
topic	Schichtwachstum (DE-588)4273432-0 gnd Solarzelle (DE-588)4181740-0 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Kesterit (DE-588)4642407-6 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Halbleiterschicht (DE-588)4158812-5 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd
topic_facet	Schichtwachstum Solarzelle Reflektometrie Dünne Schicht Kesterit Röntgendiffraktometrie Raman-Spektroskopie Halbleiterschicht Prozessüberwachung Zerstörungsfreie Werkstoffprüfung Hochschulschrift
url	https://doi.org/10.14279/depositonce-7732
volume_link	(DE-604)BV045103058
work_keys_str_mv	AT durenstephanvan developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms AT technischeuniversitatberlinuniversitatsbibliothek developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms

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