Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films:
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
Berlin
Universitätsverlag der TU Berlin
2019
|
| Series: | Advanced ceramic materials
2 |
| Subjects: | |
| Online Access: | Volltext Inhaltsverzeichnis |
| Physical Description: | xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g |
| ISBN: | 9783798330641 3798330646 |
| DOI: | 10.14279/depositonce-7732 |
Staff View
MARC
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| 245 | 1 | 0 | |a Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |c Stephan van Duren |
| 263 | |a 201906 | ||
| 264 | 1 | |a Berlin |b Universitätsverlag der TU Berlin |c 2019 | |
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| 653 | |a annealing | ||
| 653 | |a in situ process control | ||
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Record in the Search Index
| _version_ | 1804180085615362048 |
|---|---|
| adam_text | TABLE
OF
CONTENTS
SUMMARY
..................................................................................
VIII
ZUSAMMENFASSUNG
...................................................................
XII
1
|
INTRODUCTION
..................................................................20
1.1
WORLD
ENERGY
OUTLOOK
................................................
20
1.2
THIN
FILM
PHOTOVOLTAICS
..............................................
22
1.3
KESTERITE
......................................................................
23
1.3.1
KESTERITE
CHALLENGES
........................................
24
1.3.2
PREPARATION
METHODS
......................................
25
1.3.3
PROCESS
CONTROL
.................................................26
1.4
STRUCTURE
AND
AIM
OF
THE
THESIS
................................. 28
2
|
EXPERIMENTAL
TECHNIQUES
..............................................32
2.1
THIN
FILM
DEPOSITION
AND
ANNEALING
..........................32
2.1.1
SPUTTERING
.........................................................
32
2.1.2
THERMAL
(CO-)EVAPORATION
.............................. 33
2.1.3
ANNEALING
AND
SULFURIZATION
............................ 35
2.2
IN
SITU
PROCESS
CONTROL
AND
MONITORING
....................
36
2.2.1
RAMAN
SPECTROSCOPY
.......................................37
2.2.2
REFLECTOMETRY
...................................................
39
2.2.3
X-RAY
DIFFRACTION
...............................................
44
2.3
MORPHOLOGY
AND
COMPOSITION
CHARACTERIZATION
....
45
2.4
SOLAR
CELL
CHARACTERIZATION
.........................................
47
3
|
RESULTS
............................................................................
50
3.1
MANUSCRIPT
I
-
IN
SITU
MONITORING
OF
CU2ZNSNS4
ABSORBER
FORMATION
WITH
RAMAN
SPECTROSCOPY
DURING
MO/CU2SNS3/ZNS
THIN-FILM
STACK
ANNEALING
51
3.1.1
ABSTRACT
.............................................................53
3.1.2
INTRODUCTION
.....................................................
54
3.1.3
EXPERIMENTAL
METHODS
....................................
56
3.1.4
RESULTS
AND
DISCUSSION
....................................
59
3.1.5
CONCLUSION
.........................................................72
3.1.6
REFERENCES
.........................................................
74
3.1.7
SUPPLEMENTARY
INFORMATION
........................... 83
3.2
MANUSCRIPT
II
-
PRE-ANNEALING
OF
METAL
STACK
PRECURSORS
AND
ITS
BENEFICIAL
EFFECT
ON
KESTERITE
ABSORBER
PROPERTIES
AND
DEVICE
PERFORMANCE
...... 91
3.2.1
ABSTRACT
.............................................................
93
3.2.2
INTRODUCTION
.....................................................
93
3.2.3
EXPERIMENTAL
METHODS
....................................
96
3.2.4
RESULTS
AND
DISCUSSION
....................................
98
3.2.5
CONCLUSION
.......................................................
113
3.2.6
REFERENCES
.......................................................
115
3.2.7
SUPPLEMENTARY
INFORMATION
......................... 122
3.3
MANUSCRIPT
III
-
INVESTIGATION
OF
REFLECTOMETRY
FOR
IN
SITU
PROCESS
MONITORING
AND
CHARACTERIZATION
OF
CO-EVAPORATED
AND
STACKED
CU-ZN-SN-S
BASED
THIN
FILMS
.....................................127
3.3.1
ABSTRACT
...........................................................129
3.3.2
INTRODUCTION
...................................................
130
3.3.3
EXPERIMENTAL
METHODS
...................................132
3.3.4
RESULTS
AND
DISCUSSION
..................................134
3.3.5
CONCLUSION
......................................................
154
3.3.6
REFERENCES
......................................................
156
3.3.7
SUPPLEMENTARY
INFORMATION
.........................
163
4
CONCLUSIONS
AND
OUTLOOK
..........................................
165
5
REFERENCES
.................................................................171
6
LIST
OF
ABBREVIATIONS
AND
SYMBOLS
.......................... 179
7
ACKNOWLEDGEMENTS
..................................................
182
|
| any_adam_object | 1 |
| author | Duren, Stephan van |
| author_GND | (DE-588)1187870137 |
| author_facet | Duren, Stephan van |
| author_role | aut |
| author_sort | Duren, Stephan van |
| author_variant | s v d sv svd |
| building | Verbundindex |
| bvnumber | BV045912890 |
| classification_rvk | ZM 3700 ZN 5160 |
| collection | ebook |
| ctrlnum | (OCoLC)1104937103 (DE-599)DNB1187768847 |
| discipline | Chemie / Pharmazie Werkstoffwissenschaften / Fertigungstechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.14279/depositonce-7732 |
| format | Thesis Book |
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| id | DE-604.BV045912890 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:30:09Z |
| institution | BVB |
| institution_GND | (DE-588)5053182-7 |
| isbn | 9783798330641 3798330646 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031295427 |
| oclc_num | 1104937103 |
| open_access_boolean | 1 |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g |
| psigel | ebook |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Universitätsverlag der TU Berlin |
| record_format | marc |
| series | Advanced ceramic materials |
| series2 | Advanced ceramic materials |
| spelling | Duren, Stephan van Verfasser (DE-588)1187870137 aut Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren 201906 Berlin Universitätsverlag der TU Berlin 2019 xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g txt rdacontent n rdamedia nc rdacarrier Advanced ceramic materials 2 Dissertation Technische Universität Berlin 2018 Schichtwachstum (DE-588)4273432-0 gnd rswk-swf Raman-Spektroskopie (DE-588)4176916-8 gnd rswk-swf Kesterit (DE-588)4642407-6 gnd rswk-swf Prozessüberwachung (DE-588)4133922-8 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Reflektometrie (DE-588)4296759-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Solarzelle (DE-588)4181740-0 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf PNK In situ Prozesskontrolle Kesterit Optik annealing in situ process control kesterite optics phase evolution (DE-588)4113937-9 Hochschulschrift gnd-content Kesterit (DE-588)4642407-6 s Dünne Schicht (DE-588)4136925-7 s Solarzelle (DE-588)4181740-0 s Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Prozessüberwachung (DE-588)4133922-8 s Raman-Spektroskopie (DE-588)4176916-8 s Röntgendiffraktometrie (DE-588)4336833-5 s Reflektometrie (DE-588)4296759-4 s DE-604 Halbleiterschicht (DE-588)4158812-5 s Schichtwachstum (DE-588)4273432-0 s Technische Universität Berlin Universitätsbibliothek (DE-588)5053182-7 pbl Erscheint auch als Online-Ausgabe 10.14279/depositonce-7732 978-3-7983-3065-8 (DE-604)BV045912900 Advanced ceramic materials 2 (DE-604)BV045103017 2 https://doi.org/10.14279/depositonce-7732 Resolving-System kostenfrei Volltext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Duren, Stephan van Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Advanced ceramic materials Schichtwachstum (DE-588)4273432-0 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Kesterit (DE-588)4642407-6 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Solarzelle (DE-588)4181740-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4273432-0 (DE-588)4176916-8 (DE-588)4642407-6 (DE-588)4133922-8 (DE-588)4067689-4 (DE-588)4158812-5 (DE-588)4296759-4 (DE-588)4136925-7 (DE-588)4181740-0 (DE-588)4336833-5 (DE-588)4113937-9 |
| title | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_auth | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_exact_search | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_full | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_fullStr | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_full_unstemmed | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_short | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_sort | development of in situ methods for process monitoring and control and characterization of cu zn sn s based thin films |
| topic | Schichtwachstum (DE-588)4273432-0 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Kesterit (DE-588)4642407-6 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Solarzelle (DE-588)4181740-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Schichtwachstum Raman-Spektroskopie Kesterit Prozessüberwachung Zerstörungsfreie Werkstoffprüfung Halbleiterschicht Reflektometrie Dünne Schicht Solarzelle Röntgendiffraktometrie Hochschulschrift |
| url | https://doi.org/10.14279/depositonce-7732 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV045103017 |
| work_keys_str_mv | AT durenstephanvan developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms AT technischeuniversitatberlinuniversitatsbibliothek developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms |