Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
Universitätsverlag der TU Berlin
2019
|
| Schriftenreihe: | Advanced ceramic materials
2 |
| Schlagworte: | |
| Online-Zugang: | Volltext Inhaltsverzeichnis |
| Beschreibung: | xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g |
| ISBN: | 9783798330641 3798330646 |
| DOI: | 10.14279/depositonce-7732 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV045912890 | ||
| 003 | DE-604 | ||
| 005 | 20190618 | ||
| 007 | t | ||
| 008 | 190605s2019 gw a||| m||| 00||| eng d | ||
| 015 | |a 19,N24 |2 dnb | ||
| 016 | 7 | |a 1187768847 |2 DE-101 | |
| 020 | |a 9783798330641 |c : EUR 12.00 (DE), EUR 12.40 (AT) |9 978-3-7983-3064-1 | ||
| 020 | |a 3798330646 |9 3-7983-3064-6 | ||
| 024 | 3 | |a 9783798330641 | |
| 035 | |a (OCoLC)1104937103 | ||
| 035 | |a (DE-599)DNB1187768847 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-83 | ||
| 084 | |a ZM 3700 |0 (DE-625)157028: |2 rvk | ||
| 084 | |a ZN 5160 |0 (DE-625)157437: |2 rvk | ||
| 084 | |a 540 |2 sdnb | ||
| 100 | 1 | |a Duren, Stephan van |e Verfasser |0 (DE-588)1187870137 |4 aut | |
| 245 | 1 | 0 | |a Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |c Stephan van Duren |
| 263 | |a 201906 | ||
| 264 | 1 | |a Berlin |b Universitätsverlag der TU Berlin |c 2019 | |
| 300 | |a xix, 183 Seiten |b Illustrationen, Diagramme |c 21 cm x 14.8 cm, 310 g | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Advanced ceramic materials |v 2 | |
| 502 | |b Dissertation |c Technische Universität Berlin |d 2018 | ||
| 650 | 0 | 7 | |a Schichtwachstum |0 (DE-588)4273432-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Raman-Spektroskopie |0 (DE-588)4176916-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kesterit |0 (DE-588)4642407-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prozessüberwachung |0 (DE-588)4133922-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiterschicht |0 (DE-588)4158812-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Reflektometrie |0 (DE-588)4296759-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Solarzelle |0 (DE-588)4181740-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgendiffraktometrie |0 (DE-588)4336833-5 |2 gnd |9 rswk-swf |
| 653 | |a PNK | ||
| 653 | |a In situ Prozesskontrolle | ||
| 653 | |a Kesterit | ||
| 653 | |a Optik | ||
| 653 | |a annealing | ||
| 653 | |a in situ process control | ||
| 653 | |a kesterite | ||
| 653 | |a optics | ||
| 653 | |a phase evolution | ||
| 653 | |a PNK | ||
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Kesterit |0 (DE-588)4642407-6 |D s |
| 689 | 0 | 1 | |a Dünne Schicht |0 (DE-588)4136925-7 |D s |
| 689 | 0 | 2 | |a Solarzelle |0 (DE-588)4181740-0 |D s |
| 689 | 0 | 3 | |a Zerstörungsfreie Werkstoffprüfung |0 (DE-588)4067689-4 |D s |
| 689 | 0 | 4 | |a Prozessüberwachung |0 (DE-588)4133922-8 |D s |
| 689 | 0 | 5 | |a Raman-Spektroskopie |0 (DE-588)4176916-8 |D s |
| 689 | 0 | 6 | |a Röntgendiffraktometrie |0 (DE-588)4336833-5 |D s |
| 689 | 0 | 7 | |a Reflektometrie |0 (DE-588)4296759-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Kesterit |0 (DE-588)4642407-6 |D s |
| 689 | 1 | 1 | |a Halbleiterschicht |0 (DE-588)4158812-5 |D s |
| 689 | 1 | 2 | |a Schichtwachstum |0 (DE-588)4273432-0 |D s |
| 689 | 1 | 3 | |a Reflektometrie |0 (DE-588)4296759-4 |D s |
| 689 | 1 | 4 | |a Raman-Spektroskopie |0 (DE-588)4176916-8 |D s |
| 689 | 1 | 5 | |a Röntgendiffraktometrie |0 (DE-588)4336833-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 710 | 2 | |a Technische Universität Berlin |b Universitätsbibliothek |0 (DE-588)5053182-7 |4 pbl | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |o 10.14279/depositonce-7732 |z 978-3-7983-3065-8 |w (DE-604)BV045912900 |
| 830 | 0 | |a Advanced ceramic materials |v 2 |w (DE-604)BV045103017 |9 2 | |
| 856 | 4 | 1 | |u https://doi.org/10.14279/depositonce-7732 |x Resolving-System |z kostenfrei |3 Volltext |
| 856 | 4 | 2 | |m DNB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 912 | |a ebook | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031295427 | ||
Datensatz im Suchindex
| _version_ | 1804180085615362048 |
|---|---|
| adam_text | TABLE
OF
CONTENTS
SUMMARY
..................................................................................
VIII
ZUSAMMENFASSUNG
...................................................................
XII
1
|
INTRODUCTION
..................................................................20
1.1
WORLD
ENERGY
OUTLOOK
................................................
20
1.2
THIN
FILM
PHOTOVOLTAICS
..............................................
22
1.3
KESTERITE
......................................................................
23
1.3.1
KESTERITE
CHALLENGES
........................................
24
1.3.2
PREPARATION
METHODS
......................................
25
1.3.3
PROCESS
CONTROL
.................................................26
1.4
STRUCTURE
AND
AIM
OF
THE
THESIS
................................. 28
2
|
EXPERIMENTAL
TECHNIQUES
..............................................32
2.1
THIN
FILM
DEPOSITION
AND
ANNEALING
..........................32
2.1.1
SPUTTERING
.........................................................
32
2.1.2
THERMAL
(CO-)EVAPORATION
.............................. 33
2.1.3
ANNEALING
AND
SULFURIZATION
............................ 35
2.2
IN
SITU
PROCESS
CONTROL
AND
MONITORING
....................
36
2.2.1
RAMAN
SPECTROSCOPY
.......................................37
2.2.2
REFLECTOMETRY
...................................................
39
2.2.3
X-RAY
DIFFRACTION
...............................................
44
2.3
MORPHOLOGY
AND
COMPOSITION
CHARACTERIZATION
....
45
2.4
SOLAR
CELL
CHARACTERIZATION
.........................................
47
3
|
RESULTS
............................................................................
50
3.1
MANUSCRIPT
I
-
IN
SITU
MONITORING
OF
CU2ZNSNS4
ABSORBER
FORMATION
WITH
RAMAN
SPECTROSCOPY
DURING
MO/CU2SNS3/ZNS
THIN-FILM
STACK
ANNEALING
51
3.1.1
ABSTRACT
.............................................................53
3.1.2
INTRODUCTION
.....................................................
54
3.1.3
EXPERIMENTAL
METHODS
....................................
56
3.1.4
RESULTS
AND
DISCUSSION
....................................
59
3.1.5
CONCLUSION
.........................................................72
3.1.6
REFERENCES
.........................................................
74
3.1.7
SUPPLEMENTARY
INFORMATION
........................... 83
3.2
MANUSCRIPT
II
-
PRE-ANNEALING
OF
METAL
STACK
PRECURSORS
AND
ITS
BENEFICIAL
EFFECT
ON
KESTERITE
ABSORBER
PROPERTIES
AND
DEVICE
PERFORMANCE
...... 91
3.2.1
ABSTRACT
.............................................................
93
3.2.2
INTRODUCTION
.....................................................
93
3.2.3
EXPERIMENTAL
METHODS
....................................
96
3.2.4
RESULTS
AND
DISCUSSION
....................................
98
3.2.5
CONCLUSION
.......................................................
113
3.2.6
REFERENCES
.......................................................
115
3.2.7
SUPPLEMENTARY
INFORMATION
......................... 122
3.3
MANUSCRIPT
III
-
INVESTIGATION
OF
REFLECTOMETRY
FOR
IN
SITU
PROCESS
MONITORING
AND
CHARACTERIZATION
OF
CO-EVAPORATED
AND
STACKED
CU-ZN-SN-S
BASED
THIN
FILMS
.....................................127
3.3.1
ABSTRACT
...........................................................129
3.3.2
INTRODUCTION
...................................................
130
3.3.3
EXPERIMENTAL
METHODS
...................................132
3.3.4
RESULTS
AND
DISCUSSION
..................................134
3.3.5
CONCLUSION
......................................................
154
3.3.6
REFERENCES
......................................................
156
3.3.7
SUPPLEMENTARY
INFORMATION
.........................
163
4
CONCLUSIONS
AND
OUTLOOK
..........................................
165
5
REFERENCES
.................................................................171
6
LIST
OF
ABBREVIATIONS
AND
SYMBOLS
.......................... 179
7
ACKNOWLEDGEMENTS
..................................................
182
|
| any_adam_object | 1 |
| author | Duren, Stephan van |
| author_GND | (DE-588)1187870137 |
| author_facet | Duren, Stephan van |
| author_role | aut |
| author_sort | Duren, Stephan van |
| author_variant | s v d sv svd |
| building | Verbundindex |
| bvnumber | BV045912890 |
| classification_rvk | ZM 3700 ZN 5160 |
| collection | ebook |
| ctrlnum | (OCoLC)1104937103 (DE-599)DNB1187768847 |
| discipline | Chemie / Pharmazie Werkstoffwissenschaften / Fertigungstechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.14279/depositonce-7732 |
| format | Thesis Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03831nam a2200901 cb4500</leader><controlfield tag="001">BV045912890</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190618 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">190605s2019 gw a||| m||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">19,N24</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1187768847</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783798330641</subfield><subfield code="c">: EUR 12.00 (DE), EUR 12.40 (AT)</subfield><subfield code="9">978-3-7983-3064-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3798330646</subfield><subfield code="9">3-7983-3064-6</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783798330641</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1104937103</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB1187768847</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3700</subfield><subfield code="0">(DE-625)157028:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5160</subfield><subfield code="0">(DE-625)157437:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">540</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Duren, Stephan van</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1187870137</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films</subfield><subfield code="c">Stephan van Duren</subfield></datafield><datafield tag="263" ind1=" " ind2=" "><subfield code="a">201906</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Universitätsverlag der TU Berlin</subfield><subfield code="c">2019</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xix, 183 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield><subfield code="c">21 cm x 14.8 cm, 310 g</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Advanced ceramic materials</subfield><subfield code="v">2</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="b">Dissertation</subfield><subfield code="c">Technische Universität Berlin</subfield><subfield code="d">2018</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schichtwachstum</subfield><subfield code="0">(DE-588)4273432-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Raman-Spektroskopie</subfield><subfield code="0">(DE-588)4176916-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kesterit</subfield><subfield code="0">(DE-588)4642407-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prozessüberwachung</subfield><subfield code="0">(DE-588)4133922-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Reflektometrie</subfield><subfield code="0">(DE-588)4296759-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Solarzelle</subfield><subfield code="0">(DE-588)4181740-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgendiffraktometrie</subfield><subfield code="0">(DE-588)4336833-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PNK</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">In situ Prozesskontrolle</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Kesterit</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Optik</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">annealing</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">in situ process control</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">kesterite</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">optics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">phase evolution</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PNK</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Kesterit</subfield><subfield code="0">(DE-588)4642407-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Dünne Schicht</subfield><subfield code="0">(DE-588)4136925-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Solarzelle</subfield><subfield code="0">(DE-588)4181740-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Zerstörungsfreie Werkstoffprüfung</subfield><subfield code="0">(DE-588)4067689-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Prozessüberwachung</subfield><subfield code="0">(DE-588)4133922-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">Raman-Spektroskopie</subfield><subfield code="0">(DE-588)4176916-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="6"><subfield code="a">Röntgendiffraktometrie</subfield><subfield code="0">(DE-588)4336833-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="7"><subfield code="a">Reflektometrie</subfield><subfield code="0">(DE-588)4296759-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Kesterit</subfield><subfield code="0">(DE-588)4642407-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Schichtwachstum</subfield><subfield code="0">(DE-588)4273432-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="3"><subfield code="a">Reflektometrie</subfield><subfield code="0">(DE-588)4296759-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="4"><subfield code="a">Raman-Spektroskopie</subfield><subfield code="0">(DE-588)4176916-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="5"><subfield code="a">Röntgendiffraktometrie</subfield><subfield code="0">(DE-588)4336833-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Technische Universität Berlin</subfield><subfield code="b">Universitätsbibliothek</subfield><subfield code="0">(DE-588)5053182-7</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="o">10.14279/depositonce-7732</subfield><subfield code="z">978-3-7983-3065-8</subfield><subfield code="w">(DE-604)BV045912900</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Advanced ceramic materials</subfield><subfield code="v">2</subfield><subfield code="w">(DE-604)BV045103017</subfield><subfield code="9">2</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.14279/depositonce-7732</subfield><subfield code="x">Resolving-System</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">DNB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ebook</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031295427</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV045912890 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:30:09Z |
| institution | BVB |
| institution_GND | (DE-588)5053182-7 |
| isbn | 9783798330641 3798330646 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031295427 |
| oclc_num | 1104937103 |
| open_access_boolean | 1 |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g |
| psigel | ebook |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Universitätsverlag der TU Berlin |
| record_format | marc |
| series | Advanced ceramic materials |
| series2 | Advanced ceramic materials |
| spelling | Duren, Stephan van Verfasser (DE-588)1187870137 aut Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren 201906 Berlin Universitätsverlag der TU Berlin 2019 xix, 183 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 310 g txt rdacontent n rdamedia nc rdacarrier Advanced ceramic materials 2 Dissertation Technische Universität Berlin 2018 Schichtwachstum (DE-588)4273432-0 gnd rswk-swf Raman-Spektroskopie (DE-588)4176916-8 gnd rswk-swf Kesterit (DE-588)4642407-6 gnd rswk-swf Prozessüberwachung (DE-588)4133922-8 gnd rswk-swf Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Reflektometrie (DE-588)4296759-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Solarzelle (DE-588)4181740-0 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf PNK In situ Prozesskontrolle Kesterit Optik annealing in situ process control kesterite optics phase evolution (DE-588)4113937-9 Hochschulschrift gnd-content Kesterit (DE-588)4642407-6 s Dünne Schicht (DE-588)4136925-7 s Solarzelle (DE-588)4181740-0 s Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 s Prozessüberwachung (DE-588)4133922-8 s Raman-Spektroskopie (DE-588)4176916-8 s Röntgendiffraktometrie (DE-588)4336833-5 s Reflektometrie (DE-588)4296759-4 s DE-604 Halbleiterschicht (DE-588)4158812-5 s Schichtwachstum (DE-588)4273432-0 s Technische Universität Berlin Universitätsbibliothek (DE-588)5053182-7 pbl Erscheint auch als Online-Ausgabe 10.14279/depositonce-7732 978-3-7983-3065-8 (DE-604)BV045912900 Advanced ceramic materials 2 (DE-604)BV045103017 2 https://doi.org/10.14279/depositonce-7732 Resolving-System kostenfrei Volltext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Duren, Stephan van Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Advanced ceramic materials Schichtwachstum (DE-588)4273432-0 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Kesterit (DE-588)4642407-6 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Solarzelle (DE-588)4181740-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4273432-0 (DE-588)4176916-8 (DE-588)4642407-6 (DE-588)4133922-8 (DE-588)4067689-4 (DE-588)4158812-5 (DE-588)4296759-4 (DE-588)4136925-7 (DE-588)4181740-0 (DE-588)4336833-5 (DE-588)4113937-9 |
| title | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_auth | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_exact_search | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_full | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_fullStr | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_full_unstemmed | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films Stephan van Duren |
| title_short | Development of in situ methods for process monitoring and control and characterization of Cu-Zn-Sn-S based thin films |
| title_sort | development of in situ methods for process monitoring and control and characterization of cu zn sn s based thin films |
| topic | Schichtwachstum (DE-588)4273432-0 gnd Raman-Spektroskopie (DE-588)4176916-8 gnd Kesterit (DE-588)4642407-6 gnd Prozessüberwachung (DE-588)4133922-8 gnd Zerstörungsfreie Werkstoffprüfung (DE-588)4067689-4 gnd Halbleiterschicht (DE-588)4158812-5 gnd Reflektometrie (DE-588)4296759-4 gnd Dünne Schicht (DE-588)4136925-7 gnd Solarzelle (DE-588)4181740-0 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Schichtwachstum Raman-Spektroskopie Kesterit Prozessüberwachung Zerstörungsfreie Werkstoffprüfung Halbleiterschicht Reflektometrie Dünne Schicht Solarzelle Röntgendiffraktometrie Hochschulschrift |
| url | https://doi.org/10.14279/depositonce-7732 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=031295427&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV045103017 |
| work_keys_str_mv | AT durenstephanvan developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms AT technischeuniversitatberlinuniversitatsbibliothek developmentofinsitumethodsforprocessmonitoringandcontrolandcharacterizationofcuznsnsbasedthinfilms |