A beginners' guide to scanning electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2018]
|
| Schlagworte: | |
| Online-Zugang: | Inhaltstext |
| Beschreibung: | xxii, 402 Seiten Illustrationen, Diagramme |
| ISBN: | 9783319984810 3319984810 |
Internformat
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| 100 | 1 | |a Ul-Hamid, Anwar |e Verfasser |0 (DE-588)1190133202 |4 aut | |
| 245 | 1 | 0 | |a A beginners' guide to scanning electron microscopy |c Anwar Ul-Hamid |
| 264 | 1 | |a Cham |b Springer |c [2018] | |
| 300 | |a xxii, 402 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 653 | |a SEM instrumentation | ||
| 653 | |a Scanning electron microscopy | ||
| 653 | |a Specialized imaging techniques | ||
| 653 | |a components of the SEM | ||
| 653 | |a sample preparation for SEM | ||
| 653 | |a theory of specimen-beam interaction | ||
| 653 | |a PS | ||
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
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Datensatz im Suchindex
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| discipline | Maschinenbau / Maschinenwesen Physik Biologie |
| format | Book |
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| id | DE-604.BV045901560 |
| illustrated | Illustrated |
| indexdate | 2025-03-09T05:00:28Z |
| institution | BVB |
| institution_GND | (DE-588)1064344704 |
| isbn | 9783319984810 3319984810 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031284356 |
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| owner | DE-20 |
| owner_facet | DE-20 |
| physical | xxii, 402 Seiten Illustrationen, Diagramme |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| spelling | Ul-Hamid, Anwar Verfasser (DE-588)1190133202 aut A beginners' guide to scanning electron microscopy Anwar Ul-Hamid Cham Springer [2018] xxii, 402 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf SEM instrumentation Scanning electron microscopy Specialized imaging techniques components of the SEM sample preparation for SEM theory of specimen-beam interaction PS Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Springer International Publishing (DE-588)1064344704 pbl Erscheint auch als Online-Ausgabe 978-3-319-98482-7 X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=8a69df63759a4eb7910bd8b7a092dc33&prov=M&dok_var=1&dok_ext=htm Inhaltstext |
| spellingShingle | Ul-Hamid, Anwar A beginners' guide to scanning electron microscopy Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | A beginners' guide to scanning electron microscopy |
| title_auth | A beginners' guide to scanning electron microscopy |
| title_exact_search | A beginners' guide to scanning electron microscopy |
| title_full | A beginners' guide to scanning electron microscopy Anwar Ul-Hamid |
| title_fullStr | A beginners' guide to scanning electron microscopy Anwar Ul-Hamid |
| title_full_unstemmed | A beginners' guide to scanning electron microscopy Anwar Ul-Hamid |
| title_short | A beginners' guide to scanning electron microscopy |
| title_sort | a beginners guide to scanning electron microscopy |
| topic | Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Rasterelektronenmikroskopie |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=8a69df63759a4eb7910bd8b7a092dc33&prov=M&dok_var=1&dok_ext=htm |
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