Atomic force microscopy:
Gespeichert in:
| Vorheriger Titel: | Voigtländer, Bert Scanning probe microscopy |
|---|---|
| 1. Verfasser: | |
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2019]
|
| Ausgabe: | Second edition |
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Beschreibung: | 1. Aufl. u.d.T. "Scanning probe microscopy" |
| Beschreibung: | XIV, 331 Seiten Illustrationen, Diagramme |
| ISBN: | 9783030136536 |
Internformat
MARC
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| 100 | 1 | |a Voigtländer, Bert |e Verfasser |0 (DE-588)1069225231 |4 aut | |
| 245 | 1 | 0 | |a Atomic force microscopy |c Bert Voigtländer |
| 250 | |a Second edition | ||
| 264 | 1 | |a Cham |b Springer |c [2019] | |
| 300 | |a XIV, 331 Seiten |b Illustrationen, Diagramme | ||
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Datensatz im Suchindex
| _version_ | 1804180004423073792 |
|---|---|
| any_adam_object | |
| author | Voigtländer, Bert |
| author_GND | (DE-588)1069225231 |
| author_facet | Voigtländer, Bert |
| author_role | aut |
| author_sort | Voigtländer, Bert |
| author_variant | b v bv |
| building | Verbundindex |
| bvnumber | BV045864777 |
| classification_rvk | UH 6320 |
| ctrlnum | (OCoLC)1110045447 (DE-599)BVBBV045864777 |
| discipline | Physik |
| edition | Second edition |
| format | Book |
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| id | DE-604.BV045864777 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:28:52Z |
| institution | BVB |
| isbn | 9783030136536 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031248189 |
| oclc_num | 1110045447 |
| open_access_boolean | |
| owner | DE-29T DE-19 DE-BY-UBM DE-384 DE-83 |
| owner_facet | DE-29T DE-19 DE-BY-UBM DE-384 DE-83 |
| physical | XIV, 331 Seiten Illustrationen, Diagramme |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Springer |
| record_format | marc |
| series2 | NanoScience and Technology |
| spelling | Voigtländer, Bert Verfasser (DE-588)1069225231 aut Atomic force microscopy Bert Voigtländer Second edition Cham Springer [2019] XIV, 331 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier NanoScience and Technology 1. Aufl. u.d.T. "Scanning probe microscopy" bicssc bisacsh Nanotechnology Engineering Microscopy Physics Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Erscheint auch als Online-Ausgabe, eBook 978-3-030-13654-3 Vorangegangen ist Voigtländer, Bert Scanning probe microscopy 978-3-662-45239-4 |
| spellingShingle | Voigtländer, Bert Atomic force microscopy bicssc bisacsh Nanotechnology Engineering Microscopy Physics Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Atomic force microscopy |
| title_auth | Atomic force microscopy |
| title_exact_search | Atomic force microscopy |
| title_full | Atomic force microscopy Bert Voigtländer |
| title_fullStr | Atomic force microscopy Bert Voigtländer |
| title_full_unstemmed | Atomic force microscopy Bert Voigtländer |
| title_old | Voigtländer, Bert Scanning probe microscopy |
| title_short | Atomic force microscopy |
| title_sort | atomic force microscopy |
| topic | bicssc bisacsh Nanotechnology Engineering Microscopy Physics Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | bicssc bisacsh Nanotechnology Engineering Microscopy Physics Rasterkraftmikroskopie |
| work_keys_str_mv | AT voigtlanderbert atomicforcemicroscopy |