Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer Singapore
2019
Singapore Springer |
Schriftenreihe: | Springer Theses, Recognizing Outstanding Ph.D. Research
|
Schlagworte: | |
Online-Zugang: | TUM01 UBM01 UBT01 Volltext |
Beschreibung: | 1 Online-Ressource (XXIV, 147 p. 91 illus., 56 illus. in color) |
ISBN: | 9789811371073 |
ISSN: | 2190-5053 |
DOI: | 10.1007/978-981-13-7107-3 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV045860171 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 190506s2019 |||| o||u| ||||||eng d | ||
020 | |a 9789811371073 |c Online |9 978-981-137-107-3 | ||
024 | 7 | |a 10.1007/978-981-13-7107-3 |2 doi | |
035 | |a (ZDB-2-PHA)9789811371073 | ||
035 | |a (OCoLC)1101133561 | ||
035 | |a (DE-599)BVBBV045860171 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-19 |a DE-703 | ||
082 | 0 | |a 537.622 |2 23 | |
084 | |a PHY 000 |2 stub | ||
100 | 1 | |a Akiba, Kazuto |e Verfasser |4 aut | |
245 | 1 | 0 | |a Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions |c by Kazuto Akiba |
264 | 1 | |a Singapore |b Springer Singapore |c 2019 | |
264 | 1 | |a Singapore |b Springer | |
300 | |a 1 Online-Ressource (XXIV, 147 p. 91 illus., 56 illus. in color) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Springer Theses, Recognizing Outstanding Ph.D. Research |x 2190-5053 | |
650 | 4 | |a Semiconductors | |
650 | 4 | |a Optical and Electronic Materials | |
650 | 4 | |a Surface and Interface Science, Thin Films | |
650 | 4 | |a Characterization and Evaluation of Materials | |
650 | 4 | |a Solid State Physics | |
650 | 4 | |a Optical materials | |
650 | 4 | |a Surfaces (Physics) | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-137-106-6 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-137-108-0 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-981-137-109-7 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-981-13-7107-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-PHA | ||
940 | 1 | |q ZDB-2-PHA_2019_Fremddaten | |
999 | |a oai:aleph.bib-bvb.de:BVB01-031243661 | ||
966 | e | |u https://doi.org/10.1007/978-981-13-7107-3 |l TUM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-13-7107-3 |l UBM01 |p ZDB-2-PHA |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-981-13-7107-3 |l UBT01 |p ZDB-2-PHA |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804179996102623232 |
---|---|
any_adam_object | |
author | Akiba, Kazuto |
author_facet | Akiba, Kazuto |
author_role | aut |
author_sort | Akiba, Kazuto |
author_variant | k a ka |
building | Verbundindex |
bvnumber | BV045860171 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA |
ctrlnum | (ZDB-2-PHA)9789811371073 (OCoLC)1101133561 (DE-599)BVBBV045860171 |
dewey-full | 537.622 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 537 - Electricity and electronics |
dewey-raw | 537.622 |
dewey-search | 537.622 |
dewey-sort | 3537.622 |
dewey-tens | 530 - Physics |
discipline | Physik |
doi_str_mv | 10.1007/978-981-13-7107-3 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02064nmm a2200517zcb4500</leader><controlfield tag="001">BV045860171</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">190506s2019 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789811371073</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-137-107-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-981-13-7107-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-PHA)9789811371073</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1101133561</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045860171</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.622</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Akiba, Kazuto</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions</subfield><subfield code="c">by Kazuto Akiba</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer Singapore</subfield><subfield code="c">2019</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XXIV, 147 p. 91 illus., 56 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer Theses, Recognizing Outstanding Ph.D. Research</subfield><subfield code="x">2190-5053</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface and Interface Science, Thin Films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-137-106-6</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-137-108-0</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-981-137-109-7</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-981-13-7107-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_2019_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031243661</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-13-7107-3</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-13-7107-3</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-981-13-7107-3</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-PHA</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV045860171 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:28:44Z |
institution | BVB |
isbn | 9789811371073 |
issn | 2190-5053 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031243661 |
oclc_num | 1101133561 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 |
owner_facet | DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-703 |
physical | 1 Online-Ressource (XXIV, 147 p. 91 illus., 56 illus. in color) |
psigel | ZDB-2-PHA ZDB-2-PHA_2019_Fremddaten |
publishDate | 2019 |
publishDateSearch | 2019 |
publishDateSort | 2019 |
publisher | Springer Singapore Springer |
record_format | marc |
series2 | Springer Theses, Recognizing Outstanding Ph.D. Research |
spelling | Akiba, Kazuto Verfasser aut Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions by Kazuto Akiba Singapore Springer Singapore 2019 Singapore Springer 1 Online-Ressource (XXIV, 147 p. 91 illus., 56 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Theses, Recognizing Outstanding Ph.D. Research 2190-5053 Semiconductors Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics Optical materials Surfaces (Physics) Erscheint auch als Druck-Ausgabe 978-981-137-106-6 Erscheint auch als Druck-Ausgabe 978-981-137-108-0 Erscheint auch als Druck-Ausgabe 978-981-137-109-7 https://doi.org/10.1007/978-981-13-7107-3 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Akiba, Kazuto Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions Semiconductors Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics Optical materials Surfaces (Physics) |
title | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions |
title_auth | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions |
title_exact_search | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions |
title_full | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions by Kazuto Akiba |
title_fullStr | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions by Kazuto Akiba |
title_full_unstemmed | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions by Kazuto Akiba |
title_short | Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions |
title_sort | electronic states of narrow gap semiconductors under multi extreme conditions |
topic | Semiconductors Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics Optical materials Surfaces (Physics) |
topic_facet | Semiconductors Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics Optical materials Surfaces (Physics) |
url | https://doi.org/10.1007/978-981-13-7107-3 |
work_keys_str_mv | AT akibakazuto electronicstatesofnarrowgapsemiconductorsundermultiextremeconditions |