The practice of TOF-SIMS: time of flight secondary ion mass spectrometry
Saved in:
Bibliographic Details
Main Author: Spool, Alan M. ca. 20./21. Jh (Author)
Format: Book
Language:English
Published: New York, NY Momentum Press [2016]
Series:Materials characterization and analysis collection
Subjects:
Online Access:http://portal.igpublish.com/iglibrary/search/MPB0000220.html
Item Description:Literaturangaben
Physical Description:xviii, 169 Seiten Illustrationen, Diagramme
ISBN:9781606507735

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!