ToF-SIMS: materials analysis by mass spectrometry
Gespeichert in:
Weitere Verfasser: | , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Manchester
SurfaceSpectra Limited
[2013]
Chichester, West Sussex imp IM Publications [2013] |
Ausgabe: | 2nd edition |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | vii, 732 Seiten Illustrationen, Diagramme 25,3 cm |
ISBN: | 9781906715175 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
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007 | t | ||
008 | 190116s2013 a||| |||| 00||| eng d | ||
020 | |a 9781906715175 |c hardcover : GBP 180.00 |9 978-1-906715-17-5 | ||
035 | |a (OCoLC)985125247 | ||
035 | |a (DE-599)BSZ37825104X | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-706 | ||
084 | |a UP 9300 |0 (DE-625)146457: |2 rvk | ||
084 | |a 35.26 |2 bkl | ||
245 | 1 | 0 | |a ToF-SIMS |b materials analysis by mass spectrometry |c edited by John C. Vickerman, University of Manchester, UK and David Briggs, University of Nottingham, UK |
250 | |a 2nd edition | ||
264 | 1 | |a Manchester |b SurfaceSpectra Limited |c [2013] | |
264 | 1 | |a Chichester, West Sussex |b imp IM Publications |c [2013] | |
300 | |a vii, 732 Seiten |b Illustrationen, Diagramme |c 25,3 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Massenspektrometrie |0 (DE-588)4037882-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
689 | 0 | 1 | |a Massenspektrometrie |0 (DE-588)4037882-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Vickerman, John C. |4 edt | |
700 | 1 | |a Briggs, David |d 1948- |0 (DE-588)143078038 |4 edt | |
856 | 4 | 2 | |m V:DE-601;B:DE-89 |q application/pdf |u http://www.gbv.de/dms/tib-ub-hannover/766594688.pdf |y Inhaltsverzeichnis |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-030787473 |
Datensatz im Suchindex
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any_adam_object | |
author2 | Vickerman, John C. Briggs, David 1948- |
author2_role | edt edt |
author2_variant | j c v jc jcv d b db |
author_GND | (DE-588)143078038 |
author_facet | Vickerman, John C. Briggs, David 1948- |
building | Verbundindex |
bvnumber | BV045401387 |
classification_rvk | UP 9300 |
ctrlnum | (OCoLC)985125247 (DE-599)BSZ37825104X |
discipline | Physik |
edition | 2nd edition |
format | Book |
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id | DE-604.BV045401387 |
illustrated | Illustrated |
indexdate | 2024-07-10T08:17:12Z |
institution | BVB |
isbn | 9781906715175 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030787473 |
oclc_num | 985125247 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | vii, 732 Seiten Illustrationen, Diagramme 25,3 cm |
publishDate | 2013 |
publishDateSearch | 2013 |
publishDateSort | 2013 |
publisher | SurfaceSpectra Limited imp IM Publications |
record_format | marc |
spelling | ToF-SIMS materials analysis by mass spectrometry edited by John C. Vickerman, University of Manchester, UK and David Briggs, University of Nottingham, UK 2nd edition Manchester SurfaceSpectra Limited [2013] Chichester, West Sussex imp IM Publications [2013] vii, 732 Seiten Illustrationen, Diagramme 25,3 cm txt rdacontent n rdamedia nc rdacarrier Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Massenspektrometrie (DE-588)4037882-2 s DE-604 Vickerman, John C. edt Briggs, David 1948- (DE-588)143078038 edt V:DE-601;B:DE-89 application/pdf http://www.gbv.de/dms/tib-ub-hannover/766594688.pdf Inhaltsverzeichnis Inhaltsverzeichnis |
spellingShingle | ToF-SIMS materials analysis by mass spectrometry Oberflächenanalyse (DE-588)4172243-7 gnd Massenspektrometrie (DE-588)4037882-2 gnd |
subject_GND | (DE-588)4172243-7 (DE-588)4037882-2 |
title | ToF-SIMS materials analysis by mass spectrometry |
title_auth | ToF-SIMS materials analysis by mass spectrometry |
title_exact_search | ToF-SIMS materials analysis by mass spectrometry |
title_full | ToF-SIMS materials analysis by mass spectrometry edited by John C. Vickerman, University of Manchester, UK and David Briggs, University of Nottingham, UK |
title_fullStr | ToF-SIMS materials analysis by mass spectrometry edited by John C. Vickerman, University of Manchester, UK and David Briggs, University of Nottingham, UK |
title_full_unstemmed | ToF-SIMS materials analysis by mass spectrometry edited by John C. Vickerman, University of Manchester, UK and David Briggs, University of Nottingham, UK |
title_short | ToF-SIMS |
title_sort | tof sims materials analysis by mass spectrometry |
title_sub | materials analysis by mass spectrometry |
topic | Oberflächenanalyse (DE-588)4172243-7 gnd Massenspektrometrie (DE-588)4037882-2 gnd |
topic_facet | Oberflächenanalyse Massenspektrometrie |
url | http://www.gbv.de/dms/tib-ub-hannover/766594688.pdf |
work_keys_str_mv | AT vickermanjohnc tofsimsmaterialsanalysisbymassspectrometry AT briggsdavid tofsimsmaterialsanalysisbymassspectrometry |