An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
San Rafael, CA
Morgan & Claypool Publishers
[2015]
Bristol IOP Publishing [2015] |
| Ausgabe: | Version: 20151001 |
| Schriftenreihe: | IOP concise physics
|
| Schlagworte: | |
| Beschreibung: | x, ca. 66 Seiten in unterschiedlicher Zählung Illustrationen, Diagramme |
| ISBN: | 9781681740249 |
Internformat
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| 035 | |a (OCoLC)1085384575 | ||
| 035 | |a (DE-599)BVBBV045401384 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
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| 100 | 1 | |a Fearn, Sarah |e Verfasser |0 (DE-588)1108557783 |4 aut | |
| 245 | 1 | 0 | |a An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |c Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ) |
| 250 | |a Version: 20151001 | ||
| 264 | 1 | |a San Rafael, CA |b Morgan & Claypool Publishers |c [2015] | |
| 264 | 1 | |a Bristol |b IOP Publishing |c [2015] | |
| 264 | 4 | |c © 2015 | |
| 300 | |a x, ca. 66 Seiten in unterschiedlicher Zählung |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
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| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, MOBI |z 978-1-6817-4216-8 |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-1-6817-4088-1 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030787470 | ||
Datensatz im Suchindex
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| any_adam_object | |
| author | Fearn, Sarah |
| author_GND | (DE-588)1108557783 |
| author_facet | Fearn, Sarah |
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| building | Verbundindex |
| bvnumber | BV045401384 |
| ctrlnum | (OCoLC)1085384575 (DE-599)BVBBV045401384 |
| edition | Version: 20151001 |
| format | Book |
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| id | DE-604.BV045401384 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:17:12Z |
| institution | BVB |
| isbn | 9781681740249 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030787470 |
| oclc_num | 1085384575 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | x, ca. 66 Seiten in unterschiedlicher Zählung Illustrationen, Diagramme |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Morgan & Claypool Publishers IOP Publishing |
| record_format | marc |
| series2 | IOP concise physics |
| spelling | Fearn, Sarah Verfasser (DE-588)1108557783 aut An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ) Version: 20151001 San Rafael, CA Morgan & Claypool Publishers [2015] Bristol IOP Publishing [2015] © 2015 x, ca. 66 Seiten in unterschiedlicher Zählung Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier IOP concise physics Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Erscheint auch als Online-Ausgabe, MOBI 978-1-6817-4216-8 Erscheint auch als Online-Ausgabe 978-1-6817-4088-1 |
| spellingShingle | Fearn, Sarah An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Werkstoffkunde (DE-588)4079184-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4079184-1 (DE-588)4077346-2 |
| title | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_auth | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_exact_search | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_full | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ) |
| title_fullStr | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ) |
| title_full_unstemmed | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ) |
| title_short | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_sort | an introduction to time of flight secondary ion mass spectrometry tof sims and its application to materials science |
| topic | Werkstoffkunde (DE-588)4079184-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Werkstoffkunde Sekundärionen-Massenspektrometrie |
| work_keys_str_mv | AT fearnsarah anintroductiontotimeofflightsecondaryionmassspectrometrytofsimsanditsapplicationtomaterialsscience |