Chen, W., Stehr, J., & Buyanova, I. (2018). Defects in Advanced Electronic Materials and Novel Low Dimensional Structures. Woodhead Publishing, an imprint of Elsevier.
Chicago-Zitierstil (17. Ausg.)Chen, Weimin, Jan Stehr, und Irina Buyanova. Defects in Advanced Electronic Materials and Novel Low Dimensional Structures. Duxford, United Kingdom: Woodhead Publishing, an imprint of Elsevier, 2018.
MLA-Zitierstil (9. Ausg.)Chen, Weimin, et al. Defects in Advanced Electronic Materials and Novel Low Dimensional Structures. Woodhead Publishing, an imprint of Elsevier, 2018.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.