Defects in Advanced Electronic Materials and Novel Low Dimensional Structures:
"Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides,...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Duxford, United Kingdom
Woodhead Publishing, an imprint of Elsevier
[2018]
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FLA01 Volltext |
| Zusammenfassung: | "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"-- |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 online resource |
| ISBN: | 9780081020548 0081020546 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045383245 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181228s2018 |||| o||u| ||||||eng d | ||
| 015 | |a GBB890521 |2 dnb | ||
| 020 | |a 9780081020548 |9 978-0-08-102054-8 | ||
| 020 | |a 0081020546 |9 0-08-102054-6 | ||
| 035 | |a (ZDB-33-ESD)on1041152761 | ||
| 035 | |a (ZDB-33-EBS)on1041152761 | ||
| 035 | |a (OCoLC)1041152761 | ||
| 035 | |a (DE-599)BVBBV045383245 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 620.11 |2 23 | |
| 084 | |a ZN 3400 |0 (DE-625)157307: |2 rvk | ||
| 245 | 1 | 0 | |a Defects in Advanced Electronic Materials and Novel Low Dimensional Structures |c edited by Jan Stehr, Irina Buyanova, Weimin Chen |
| 264 | 1 | |a Duxford, United Kingdom |b Woodhead Publishing, an imprint of Elsevier |c [2018] | |
| 264 | 4 | |c © 2018 | |
| 300 | |a 1 online resource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 520 | |a "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"-- | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Engineering (General) |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Reference |2 bisacsh | |
| 650 | 4 | |a Smart materials |x Defects | |
| 650 | 4 | |a Nanostructured materials |x Defects | |
| 650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Technischer Fehler |0 (DE-588)4251278-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektrotechnik |0 (DE-588)4014390-9 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektrotechnik |0 (DE-588)4014390-9 |D s |
| 689 | 0 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 0 | 2 | |a Technischer Fehler |0 (DE-588)4251278-5 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Chen, Weimin |4 edt | |
| 700 | 1 | |a Stehr, Jan |4 edt | |
| 700 | 1 | |a Buyanova, Irina |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9780081020531 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 0081020538 |
| 856 | 4 | 0 | |u https://www.sciencedirect.com/science/book/9780081020531 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030769578 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://www.sciencedirect.com/science/book/9780081020531 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
| 966 | e | |u https://www.sciencedirect.com/science/book/9780081020531 |l FLA01 |p ZDB-33-ESD |q FLA_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804179236223713280 |
|---|---|
| any_adam_object | |
| author2 | Chen, Weimin Stehr, Jan Buyanova, Irina |
| author2_role | edt edt edt |
| author2_variant | w c wc j s js i b ib |
| author_facet | Chen, Weimin Stehr, Jan Buyanova, Irina |
| building | Verbundindex |
| bvnumber | BV045383245 |
| classification_rvk | ZN 3400 |
| collection | ZDB-33-ESD ZDB-33-EBS |
| ctrlnum | (ZDB-33-ESD)on1041152761 (ZDB-33-EBS)on1041152761 (OCoLC)1041152761 (DE-599)BVBBV045383245 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03698nmm a2200601zc 4500</leader><controlfield tag="001">BV045383245</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181228s2018 |||| o||u| ||||||eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBB890521</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780081020548</subfield><subfield code="9">978-0-08-102054-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0081020546</subfield><subfield code="9">0-08-102054-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)on1041152761</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-EBS)on1041152761</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1041152761</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045383245</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.11</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 3400</subfield><subfield code="0">(DE-625)157307:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defects in Advanced Electronic Materials and Novel Low Dimensional Structures</subfield><subfield code="c">edited by Jan Stehr, Irina Buyanova, Weimin Chen</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Duxford, United Kingdom</subfield><subfield code="b">Woodhead Publishing, an imprint of Elsevier</subfield><subfield code="c">[2018]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">"Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"--</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Engineering (General)</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Reference</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Smart materials</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanostructured materials</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Technischer Fehler</subfield><subfield code="0">(DE-588)4251278-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrotechnik</subfield><subfield code="0">(DE-588)4014390-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektrotechnik</subfield><subfield code="0">(DE-588)4014390-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Technischer Fehler</subfield><subfield code="0">(DE-588)4251278-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chen, Weimin</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Stehr, Jan</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Buyanova, Irina</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9780081020531</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">0081020538</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://www.sciencedirect.com/science/book/9780081020531</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030769578</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://www.sciencedirect.com/science/book/9780081020531</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://www.sciencedirect.com/science/book/9780081020531</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FLA_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045383245 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:16:39Z |
| institution | BVB |
| isbn | 9780081020548 0081020546 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030769578 |
| oclc_num | 1041152761 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 online resource |
| psigel | ZDB-33-ESD ZDB-33-EBS ZDB-33-ESD FAW_PDA_ESD ZDB-33-ESD FLA_PDA_ESD |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Woodhead Publishing, an imprint of Elsevier |
| record_format | marc |
| spelling | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures edited by Jan Stehr, Irina Buyanova, Weimin Chen Duxford, United Kingdom Woodhead Publishing, an imprint of Elsevier [2018] © 2018 1 online resource txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"-- TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Smart materials Defects Nanostructured materials Defects Werkstoff (DE-588)4065579-9 gnd rswk-swf Technischer Fehler (DE-588)4251278-5 gnd rswk-swf Elektrotechnik (DE-588)4014390-9 gnd rswk-swf Elektrotechnik (DE-588)4014390-9 s Werkstoff (DE-588)4065579-9 s Technischer Fehler (DE-588)4251278-5 s 1\p DE-604 Chen, Weimin edt Stehr, Jan edt Buyanova, Irina edt Erscheint auch als Druck-Ausgabe 9780081020531 Erscheint auch als Druck-Ausgabe 0081020538 https://www.sciencedirect.com/science/book/9780081020531 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Smart materials Defects Nanostructured materials Defects Werkstoff (DE-588)4065579-9 gnd Technischer Fehler (DE-588)4251278-5 gnd Elektrotechnik (DE-588)4014390-9 gnd |
| subject_GND | (DE-588)4065579-9 (DE-588)4251278-5 (DE-588)4014390-9 |
| title | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures |
| title_auth | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures |
| title_exact_search | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures |
| title_full | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures edited by Jan Stehr, Irina Buyanova, Weimin Chen |
| title_fullStr | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures edited by Jan Stehr, Irina Buyanova, Weimin Chen |
| title_full_unstemmed | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures edited by Jan Stehr, Irina Buyanova, Weimin Chen |
| title_short | Defects in Advanced Electronic Materials and Novel Low Dimensional Structures |
| title_sort | defects in advanced electronic materials and novel low dimensional structures |
| topic | TECHNOLOGY & ENGINEERING / Engineering (General) bisacsh TECHNOLOGY & ENGINEERING / Reference bisacsh Smart materials Defects Nanostructured materials Defects Werkstoff (DE-588)4065579-9 gnd Technischer Fehler (DE-588)4251278-5 gnd Elektrotechnik (DE-588)4014390-9 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Engineering (General) TECHNOLOGY & ENGINEERING / Reference Smart materials Defects Nanostructured materials Defects Werkstoff Technischer Fehler Elektrotechnik |
| url | https://www.sciencedirect.com/science/book/9780081020531 |
| work_keys_str_mv | AT chenweimin defectsinadvancedelectronicmaterialsandnovellowdimensionalstructures AT stehrjan defectsinadvancedelectronicmaterialsandnovellowdimensionalstructures AT buyanovairina defectsinadvancedelectronicmaterialsandnovellowdimensionalstructures |