On-wafer microwave measurements and de-embedding:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Artech House
[2016]
|
| Schriftenreihe: | Artech House microwave library
|
| Schlagworte: | |
| Online-Zugang: | TUM01 |
| Beschreibung: | 1 online resource (xxvii, 216 pages) illustrations |
| ISBN: | 9781630813710 |
Internformat
MARC
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| 020 | |a 9781630813710 |9 978-1-63081-371-0 | ||
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| 100 | 1 | |a Lourandakis, Errikos |d 1981- |e Verfasser |0 (DE-588)137973292 |4 aut | |
| 245 | 1 | 0 | |a On-wafer microwave measurements and de-embedding |c Errikos Lourandakis |
| 264 | 1 | |a Boston |b Artech House |c [2016] | |
| 300 | |a 1 online resource (xxvii, 216 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
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| 490 | 0 | |a Artech House microwave library | |
| 505 | 8 | |a This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards | |
| 650 | 7 | |a Microwave measurements |2 fast | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Mechanical |2 bisacsh | |
| 650 | 4 | |a Microwave integrated circuits |a Microwave measurements | |
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Datensatz im Suchindex
| _version_ | 1804179167470682112 |
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| any_adam_object | |
| author | Lourandakis, Errikos 1981- |
| author_GND | (DE-588)137973292 |
| author_facet | Lourandakis, Errikos 1981- |
| author_role | aut |
| author_sort | Lourandakis, Errikos 1981- |
| author_variant | e l el |
| building | Verbundindex |
| bvnumber | BV045346038 |
| collection | ZDB-203-AHO ZDB-4-ENC |
| contents | This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards |
| ctrlnum | (ZDB-4-ENC)ocn986864633 (OCoLC)986864633 (DE-599)BVBBV045346038 |
| dewey-full | 621.3813 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3813 |
| dewey-search | 621.3813 |
| dewey-sort | 3621.3813 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV045346038 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:34Z |
| institution | BVB |
| isbn | 9781630813710 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030732742 |
| oclc_num | 986864633 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 online resource (xxvii, 216 pages) illustrations |
| psigel | ZDB-203-AHO ZDB-4-ENC ZDB-203-AHO TUM_Paketkauf |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Lourandakis, Errikos 1981- Verfasser (DE-588)137973292 aut On-wafer microwave measurements and de-embedding Errikos Lourandakis Boston Artech House [2016] 1 online resource (xxvii, 216 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Artech House microwave library This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards Microwave measurements fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Microwave integrated circuits Microwave measurements Erscheint auch als Druck-Ausgabe 978-1-63081-056-6 |
| spellingShingle | Lourandakis, Errikos 1981- On-wafer microwave measurements and de-embedding This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards Microwave measurements fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Microwave integrated circuits Microwave measurements |
| title | On-wafer microwave measurements and de-embedding |
| title_auth | On-wafer microwave measurements and de-embedding |
| title_exact_search | On-wafer microwave measurements and de-embedding |
| title_full | On-wafer microwave measurements and de-embedding Errikos Lourandakis |
| title_fullStr | On-wafer microwave measurements and de-embedding Errikos Lourandakis |
| title_full_unstemmed | On-wafer microwave measurements and de-embedding Errikos Lourandakis |
| title_short | On-wafer microwave measurements and de-embedding |
| title_sort | on wafer microwave measurements and de embedding |
| topic | Microwave measurements fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Microwave integrated circuits Microwave measurements |
| topic_facet | Microwave measurements TECHNOLOGY & ENGINEERING / Mechanical Microwave integrated circuits Microwave measurements |
| work_keys_str_mv | AT lourandakiserrikos onwafermicrowavemeasurementsanddeembedding |