Auger electron spectroscopy: practical application to materials analysis and characterization of surfaces, interfaces, and thin films
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, [New York] (222 East 46th Street, New York, NY 10017)
Momentum Press
2015
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| Schriftenreihe: | Materials characterization and analysis collection
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| Schlagworte: | |
| Beschreibung: | Title from PDF title page (viewed on July 25, 2015) |
| Beschreibung: | 1 online resource (1 PDF (xxvi, 224 pages) :) illustrations |
| ISBN: | 9781606506820 160650682X |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045345704 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2015 |||| o||u| ||||||eng d | ||
| 020 | |a 9781606506820 |9 978-1-60650-682-0 | ||
| 020 | |a 160650682X |9 1-60650-682-X | ||
| 035 | |a (ZDB-4-ENC)ocn914432297 | ||
| 035 | |a (OCoLC)914432297 | ||
| 035 | |a (DE-599)BVBBV045345704 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 535.3325 |2 23 | |
| 100 | 1 | |a Wolstenholme, John. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Auger electron spectroscopy |b practical application to materials analysis and characterization of surfaces, interfaces, and thin films |c John Wolstenholme |
| 264 | 1 | |a New York, [New York] (222 East 46th Street, New York, NY 10017) |b Momentum Press |c 2015 | |
| 300 | |a 1 online resource (1 PDF (xxvi, 224 pages) :) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Materials characterization and analysis collection | |
| 500 | |a Title from PDF title page (viewed on July 25, 2015) | ||
| 505 | 8 | |a Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed | |
| 650 | 7 | |a Auger electron spectroscopy |2 fast | |
| 650 | 7 | |a SCIENCE / Physics / Optics & Light |2 bisacsh | |
| 650 | 4 | |a Auger electron spectroscopy | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781606506813 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030732407 | ||
Datensatz im Suchindex
| _version_ | 1804179166817419264 |
|---|---|
| any_adam_object | |
| author | Wolstenholme, John |
| author_facet | Wolstenholme, John |
| author_role | aut |
| author_sort | Wolstenholme, John |
| author_variant | j w jw |
| building | Verbundindex |
| bvnumber | BV045345704 |
| collection | ZDB-4-ENC |
| contents | Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed |
| ctrlnum | (ZDB-4-ENC)ocn914432297 (OCoLC)914432297 (DE-599)BVBBV045345704 |
| dewey-full | 535.3325 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 535 - Light and related radiation |
| dewey-raw | 535.3325 |
| dewey-search | 535.3325 |
| dewey-sort | 3535.3325 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03190nmm a2200373zc 4500</leader><controlfield tag="001">BV045345704</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781606506820</subfield><subfield code="9">978-1-60650-682-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">160650682X</subfield><subfield code="9">1-60650-682-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn914432297</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)914432297</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045345704</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">535.3325</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wolstenholme, John.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Auger electron spectroscopy</subfield><subfield code="b">practical application to materials analysis and characterization of surfaces, interfaces, and thin films</subfield><subfield code="c">John Wolstenholme</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, [New York] (222 East 46th Street, New York, NY 10017)</subfield><subfield code="b">Momentum Press</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (1 PDF (xxvi, 224 pages) :)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Materials characterization and analysis collection</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Title from PDF title page (viewed on July 25, 2015)</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Auger electron spectroscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Optics & Light</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Auger electron spectroscopy</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781606506813</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030732407</subfield></datafield></record></collection> |
| id | DE-604.BV045345704 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:33Z |
| institution | BVB |
| isbn | 9781606506820 160650682X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030732407 |
| oclc_num | 914432297 |
| open_access_boolean | |
| physical | 1 online resource (1 PDF (xxvi, 224 pages) :) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Momentum Press |
| record_format | marc |
| series2 | Materials characterization and analysis collection |
| spelling | Wolstenholme, John. Verfasser aut Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films John Wolstenholme New York, [New York] (222 East 46th Street, New York, NY 10017) Momentum Press 2015 1 online resource (1 PDF (xxvi, 224 pages) :) illustrations txt rdacontent c rdamedia cr rdacarrier Materials characterization and analysis collection Title from PDF title page (viewed on July 25, 2015) Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed Auger electron spectroscopy fast SCIENCE / Physics / Optics & Light bisacsh Auger electron spectroscopy Erscheint auch als Druck-Ausgabe 9781606506813 |
| spellingShingle | Wolstenholme, John Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed Auger electron spectroscopy fast SCIENCE / Physics / Optics & Light bisacsh Auger electron spectroscopy |
| title | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films |
| title_auth | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films |
| title_exact_search | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films |
| title_full | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films John Wolstenholme |
| title_fullStr | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films John Wolstenholme |
| title_full_unstemmed | Auger electron spectroscopy practical application to materials analysis and characterization of surfaces, interfaces, and thin films John Wolstenholme |
| title_short | Auger electron spectroscopy |
| title_sort | auger electron spectroscopy practical application to materials analysis and characterization of surfaces interfaces and thin films |
| title_sub | practical application to materials analysis and characterization of surfaces, interfaces, and thin films |
| topic | Auger electron spectroscopy fast SCIENCE / Physics / Optics & Light bisacsh Auger electron spectroscopy |
| topic_facet | Auger electron spectroscopy SCIENCE / Physics / Optics & Light |
| work_keys_str_mv | AT wolstenholmejohn augerelectronspectroscopypracticalapplicationtomaterialsanalysisandcharacterizationofsurfacesinterfacesandthinfilms |