Measurement technology and intelligent instruments VI:
Gespeichert in:
Format: | Elektronisch E-Book |
---|---|
Sprache: | English |
Veröffentlicht: |
Uetikon-Zuerich, Switzerland ; Enfield, NH
Trans Tech Publications Ltd.
[2005]
|
Schriftenreihe: | Key engineering materials
volume 295-296 |
Schlagworte: | |
Beschreibung: | "Sponsored by International Committee on Measurements and Instrumentation (ICMI) [and others]"--Opposite of title page verso. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Print version record |
Beschreibung: | 1 online resource (xvi, 768 pages) illustrations |
ISBN: | 9783038130222 3038130222 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV045345337 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 181206s2005 |||| o||u| ||||||eng d | ||
020 | |a 9783038130222 |9 978-3-03813-022-2 | ||
020 | |a 3038130222 |9 3-03813-022-2 | ||
035 | |a (ZDB-4-ENC)ocn860712582 | ||
035 | |a (OCoLC)860712582 | ||
035 | |a (DE-599)BVBBV045345337 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
082 | 0 | |a 681.2 |2 22 | |
084 | |a ZQ 3105 |0 (DE-625)158037: |2 rvk | ||
245 | 1 | 0 | |a Measurement technology and intelligent instruments VI |c edited by Yongsheng Gao, Shuetfung Tse, Wei Gao |
264 | 1 | |a Uetikon-Zuerich, Switzerland ; Enfield, NH |b Trans Tech Publications Ltd. |c [2005] | |
264 | 4 | |c 2005 | |
300 | |a 1 online resource (xvi, 768 pages) |b illustrations | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Key engineering materials |v volume 295-296 | |
500 | |a "Sponsored by International Committee on Measurements and Instrumentation (ICMI) [and others]"--Opposite of title page verso. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 | ||
500 | |a Print version record | ||
505 | 8 | |a The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, "Measurement Technology and Intelligent Instruments", this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US. The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost | |
650 | 7 | |a TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades |2 bisacsh | |
650 | 7 | |a Engineering instruments |2 fast | |
650 | 7 | |a Measuring instruments |2 fast | |
650 | 4 | |a Engineering instruments |a Measuring instruments | |
650 | 0 | 7 | |a Hochleistungswerkstoff |0 (DE-588)4312250-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Messtechnik |0 (DE-588)4114575-6 |2 gnd |9 rswk-swf |
655 | 7 | |8 1\p |0 (DE-588)1071861417 |a Konferenzschrift |y 2003 |z Hongkong |2 gnd-content | |
689 | 0 | 0 | |a Hochleistungswerkstoff |0 (DE-588)4312250-4 |D s |
689 | 0 | 1 | |a Messtechnik |0 (DE-588)4114575-6 |D s |
689 | 0 | |8 2\p |5 DE-604 | |
700 | 1 | |a Gao, Yongsheng |e Sonstige |4 oth | |
700 | 1 | |a Tse, Shuetfung |e Sonstige |4 oth | |
700 | 1 | |a Gao, Wei |d 1962- |e Sonstige |4 oth | |
710 | 2 | |a International Committee on Measurements and Instrumentation |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |t Measurement technology and intelligent instruments VI |z 0878499776 |
912 | |a ZDB-4-ENC | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-030732038 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804179166038327296 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV045345337 |
classification_rvk | ZQ 3105 |
collection | ZDB-4-ENC |
contents | The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, "Measurement Technology and Intelligent Instruments", this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US. The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost |
ctrlnum | (ZDB-4-ENC)ocn860712582 (OCoLC)860712582 (DE-599)BVBBV045345337 |
dewey-full | 681.2 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 681 - Precision instruments and other devices |
dewey-raw | 681.2 |
dewey-search | 681.2 |
dewey-sort | 3681.2 |
dewey-tens | 680 - Manufacture of products for specific uses |
discipline | Handwerk und Gewerbe / Verschiedene Technologien Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04339nmm a2200553zcb4500</leader><controlfield tag="001">BV045345337</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2005 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783038130222</subfield><subfield code="9">978-3-03813-022-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3038130222</subfield><subfield code="9">3-03813-022-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn860712582</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)860712582</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045345337</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">681.2</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3105</subfield><subfield code="0">(DE-625)158037:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Measurement technology and intelligent instruments VI</subfield><subfield code="c">edited by Yongsheng Gao, Shuetfung Tse, Wei Gao</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Uetikon-Zuerich, Switzerland ; Enfield, NH</subfield><subfield code="b">Trans Tech Publications Ltd.</subfield><subfield code="c">[2005]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xvi, 768 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Key engineering materials</subfield><subfield code="v">volume 295-296</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">"Sponsored by International Committee on Measurements and Instrumentation (ICMI) [and others]"--Opposite of title page verso. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, "Measurement Technology and Intelligent Instruments", this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US. The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Engineering instruments</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Measuring instruments</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering instruments</subfield><subfield code="a">Measuring instruments</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochleistungswerkstoff</subfield><subfield code="0">(DE-588)4312250-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2003</subfield><subfield code="z">Hongkong</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Hochleistungswerkstoff</subfield><subfield code="0">(DE-588)4312250-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Messtechnik</subfield><subfield code="0">(DE-588)4114575-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gao, Yongsheng</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tse, Shuetfung</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gao, Wei</subfield><subfield code="d">1962-</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">International Committee on Measurements and Instrumentation</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="t">Measurement technology and intelligent instruments VI</subfield><subfield code="z">0878499776</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030732038</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | 1\p (DE-588)1071861417 Konferenzschrift 2003 Hongkong gnd-content |
genre_facet | Konferenzschrift 2003 Hongkong |
id | DE-604.BV045345337 |
illustrated | Illustrated |
indexdate | 2024-07-10T08:15:32Z |
institution | BVB |
isbn | 9783038130222 3038130222 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030732038 |
oclc_num | 860712582 |
open_access_boolean | |
physical | 1 online resource (xvi, 768 pages) illustrations |
psigel | ZDB-4-ENC |
publishDate | 2005 |
publishDateSearch | 2005 |
publishDateSort | 2005 |
publisher | Trans Tech Publications Ltd. |
record_format | marc |
series2 | Key engineering materials |
spelling | Measurement technology and intelligent instruments VI edited by Yongsheng Gao, Shuetfung Tse, Wei Gao Uetikon-Zuerich, Switzerland ; Enfield, NH Trans Tech Publications Ltd. [2005] 2005 1 online resource (xvi, 768 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Key engineering materials volume 295-296 "Sponsored by International Committee on Measurements and Instrumentation (ICMI) [and others]"--Opposite of title page verso. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Print version record The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, "Measurement Technology and Intelligent Instruments", this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US. The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades bisacsh Engineering instruments fast Measuring instruments fast Engineering instruments Measuring instruments Hochleistungswerkstoff (DE-588)4312250-4 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 2003 Hongkong gnd-content Hochleistungswerkstoff (DE-588)4312250-4 s Messtechnik (DE-588)4114575-6 s 2\p DE-604 Gao, Yongsheng Sonstige oth Tse, Shuetfung Sonstige oth Gao, Wei 1962- Sonstige oth International Committee on Measurements and Instrumentation Sonstige oth Erscheint auch als Druck-Ausgabe Measurement technology and intelligent instruments VI 0878499776 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Measurement technology and intelligent instruments VI The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, "Measurement Technology and Intelligent Instruments", this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US. The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades bisacsh Engineering instruments fast Measuring instruments fast Engineering instruments Measuring instruments Hochleistungswerkstoff (DE-588)4312250-4 gnd Messtechnik (DE-588)4114575-6 gnd |
subject_GND | (DE-588)4312250-4 (DE-588)4114575-6 (DE-588)1071861417 |
title | Measurement technology and intelligent instruments VI |
title_auth | Measurement technology and intelligent instruments VI |
title_exact_search | Measurement technology and intelligent instruments VI |
title_full | Measurement technology and intelligent instruments VI edited by Yongsheng Gao, Shuetfung Tse, Wei Gao |
title_fullStr | Measurement technology and intelligent instruments VI edited by Yongsheng Gao, Shuetfung Tse, Wei Gao |
title_full_unstemmed | Measurement technology and intelligent instruments VI edited by Yongsheng Gao, Shuetfung Tse, Wei Gao |
title_short | Measurement technology and intelligent instruments VI |
title_sort | measurement technology and intelligent instruments vi |
topic | TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades bisacsh Engineering instruments fast Measuring instruments fast Engineering instruments Measuring instruments Hochleistungswerkstoff (DE-588)4312250-4 gnd Messtechnik (DE-588)4114575-6 gnd |
topic_facet | TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades Engineering instruments Measuring instruments Engineering instruments Measuring instruments Hochleistungswerkstoff Messtechnik Konferenzschrift 2003 Hongkong |
work_keys_str_mv | AT gaoyongsheng measurementtechnologyandintelligentinstrumentsvi AT tseshuetfung measurementtechnologyandintelligentinstrumentsvi AT gaowei measurementtechnologyandintelligentinstrumentsvi AT internationalcommitteeonmeasurementsandinstrumentation measurementtechnologyandintelligentinstrumentsvi |