Semiconductor strain metrology: principles and applications
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Bibliographic Details
Main Author: Wong, Terence K. S. (Author)
Format: Electronic eBook
Language:English
Published: [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL Bentham Science [2012]
Subjects:
Physical Description:1 online resource (136 pages :) illustrations
ISBN:9781608053599
1608053598

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!