ISTFA 2011: conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2011
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| Schlagworte: | |
| Beschreibung: | Some online versions lack accompanying media packaged with the printed version Print version record |
| Beschreibung: | 1 online resource (xix, 456 pages) illustrations |
| ISBN: | 9781615038503 1615038507 9781680155112 1680155113 |
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| 246 | 1 | 3 | |a International Symposium for Testing and Failure Analysis 2011 |
| 246 | 1 | 3 | |a Conference proceedings of the 37th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a 37th International Symposium for Testing and Failure Analysis |
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Datensatz im Suchindex
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| spelling | International Symposium for Testing and Failure Analysis < 2011, San Jose, Calif.> Verfasser aut ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis sponsored by EDFAS, ISTFA/2011, ASM International International Symposium for Testing and Failure Analysis 2011 Conference proceedings of the 37th International Symposium for Testing and Failure Analysis 37th International Symposium for Testing and Failure Analysis Thirty-seventh International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2011 1 online resource (xix, 456 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Some online versions lack accompanying media packaged with the printed version Print version record TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses 1\p (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis Society Sonstige oth International Symposium for Testing and Failure Analysis/2011 Sonstige oth ASM International Sonstige oth Erscheint auch als Druck-Ausgabe International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) ISTFA 2011 Materials Park, OH : ASM International, 2011 9781615038268 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis |
| title_alt | International Symposium for Testing and Failure Analysis 2011 Conference proceedings of the 37th International Symposium for Testing and Failure Analysis 37th International Symposium for Testing and Failure Analysis Thirty-seventh International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis |
| title_exact_search | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis |
| title_full | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis sponsored by EDFAS, ISTFA/2011, ASM International |
| title_fullStr | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis sponsored by EDFAS, ISTFA/2011, ASM International |
| title_full_unstemmed | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis sponsored by EDFAS, ISTFA/2011, ASM International |
| title_short | ISTFA 2011 |
| title_sort | istfa 2011 conference proceedings from the 37th international symposium for testing and failure analysis november 13 17 2011 san jose convention center san jose california thirty seventh international symposium for testing and failure analysis |
| title_sub | conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California = Thirty-seventh International Symposium for Testing and Failure Analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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