Microelectronics failure analysis: desk reference = Microelectronics failure analysis desk reference
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2011
|
| Ausgabe: | 6th ed |
| Schlagworte: |
Microelectronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Defects
> Testing
> Handbooks, manuals, etc
> Electronic apparatus and appliances
> Testing
> Handbooks, manuals, etc
> Electronics
> Materials
> Testing
> Handbooks, manuals, etc
> Electronics
> Materials
> Defects
> Handbooks, manuals, etc
|
| Beschreibung: | "ASM International, 2011, no. 09110Z"--Page 4 of cover. - Some online versions lack accompanying media packaged with the printed version Print version record |
| Beschreibung: | 1 online resource (xi, 660 pages) illustrations |
| ISBN: | 9781613447598 1613447590 9781615037261 1615037268 |
Internformat
MARC
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| 020 | |a 9781615037261 |9 978-1-61503-726-1 | ||
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| 245 | 1 | 0 | |a Microelectronics failure analysis |b desk reference = Microelectronics failure analysis desk reference |c edited by Richard J. Ross ; EDFAS, ASM International |
| 246 | 1 | 3 | |a Microelectronics failure analysis desk reference |
| 246 | 1 | 1 | |a Microelectronics failure analysis desk reference |
| 250 | |a 6th ed | ||
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c 2011 | |
| 300 | |a 1 online resource (xi, 660 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a "ASM International, 2011, no. 09110Z"--Page 4 of cover. - Some online versions lack accompanying media packaged with the printed version | ||
| 500 | |a Print version record | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
| 650 | 7 | |a Electronics / Materials / Defects |2 fast | |
| 650 | 7 | |a Electronics / Materials / Testing |2 fast | |
| 650 | 7 | |a Microelectronics / Materials / Testing |2 fast | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc |a Microelectronics |x Defects |x Testing |v Handbooks, manuals, etc |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc |a Electronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 700 | 1 | |a Ross, Richard J. |e Sonstige |4 oth | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |t Microelectronics failure analysis |b 6th ed |d Materials Park, Ohio : ASM International, 2011 |z 161503725X |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030731367 | ||
Datensatz im Suchindex
| _version_ | 1804179164654206976 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV045344663 |
| collection | ZDB-4-ENC |
| ctrlnum | (ZDB-4-ENC)ocn771901447 (OCoLC)771901447 (DE-599)BVBBV045344663 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 6th ed |
| format | Electronic eBook |
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| id | DE-604.BV045344663 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:31Z |
| institution | BVB |
| isbn | 9781613447598 1613447590 9781615037261 1615037268 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030731367 |
| oclc_num | 771901447 |
| open_access_boolean | |
| physical | 1 online resource (xi, 660 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International Microelectronics failure analysis desk reference 6th ed Materials Park, Ohio ASM International 2011 1 online resource (xi, 660 pages) illustrations txt rdacontent c rdamedia cr rdacarrier "ASM International, 2011, no. 09110Z"--Page 4 of cover. - Some online versions lack accompanying media packaged with the printed version Print version record TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc Ross, Richard J. Sonstige oth ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe Microelectronics failure analysis 6th ed Materials Park, Ohio : ASM International, 2011 161503725X |
| spellingShingle | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference |
| title_alt | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_fullStr | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_full_unstemmed | Microelectronics failure analysis desk reference = Microelectronics failure analysis desk reference edited by Richard J. Ross ; EDFAS, ASM International |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference microelectronics failure analysis desk reference |
| title_sub | desk reference = Microelectronics failure analysis desk reference |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Defects Electronics / Materials / Testing Microelectronics / Materials / Testing Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
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