Advanced measurement and test: selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Stafa-Zurich, Switzerland ; Enfield, NH
Trans Tech Publications
2010
|
| Schriftenreihe: | Key engineering materials
v. 439-440 |
| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (2 volumes (xxi, 1643 pages)) illustrations |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045344084 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2010 |||| o||u| ||||||eng d | ||
| 035 | |a (ZDB-4-ENC)ocn670535635 | ||
| 035 | |a (OCoLC)670535635 | ||
| 035 | |a (DE-599)BVBBV045344084 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 110 | 2 | |a International Conference on Advanced Measurement and Test <2010, Sanya Shi, China> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced measurement and test |b selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X |c edited by Yanwen Wu |
| 246 | 1 | 3 | |a International Conference on Advanced Measurement and Test |
| 246 | 1 | 3 | |a AMT 2010 |
| 246 | 1 | 3 | |a Advanced Measurement and Test X |
| 246 | 1 | 1 | |a Advanced Measurement and Test X |
| 264 | 1 | |a Stafa-Zurich, Switzerland ; Enfield, NH |b Trans Tech Publications |c 2010 | |
| 300 | |a 1 online resource (2 volumes (xxi, 1643 pages)) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Key engineering materials |v v. 439-440 | |
| 500 | |a Print version record | ||
| 650 | 7 | |a Electric measurements |2 fast | |
| 650 | 7 | |a Electronic measurements |2 fast | |
| 650 | 7 | |a Materials / Testing |2 fast | |
| 650 | 4 | |a Electric measurements |v Congresses |a Electronic measurements |v Congresses |a Materials |x Testing |v Congresses | |
| 700 | 1 | |a Wu, Yanwen |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China) |t Advanced measurement and test |d Stafa-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, Ltd., 2010 |z 9780878492718 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030730788 | ||
Datensatz im Suchindex
| _version_ | 1804179163469316096 |
|---|---|
| any_adam_object | |
| author_corporate | International Conference on Advanced Measurement and Test <2010, Sanya Shi, China> |
| author_corporate_role | aut |
| author_facet | International Conference on Advanced Measurement and Test <2010, Sanya Shi, China> |
| author_sort | International Conference on Advanced Measurement and Test <2010, Sanya Shi, China> |
| building | Verbundindex |
| bvnumber | BV045344084 |
| collection | ZDB-4-ENC |
| ctrlnum | (ZDB-4-ENC)ocn670535635 (OCoLC)670535635 (DE-599)BVBBV045344084 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01885nmm a2200397zcb4500</leader><controlfield tag="001">BV045344084</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn670535635</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)670535635</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045344084</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Conference on Advanced Measurement and Test <2010, Sanya Shi, China></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced measurement and test</subfield><subfield code="b">selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X</subfield><subfield code="c">edited by Yanwen Wu</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">International Conference on Advanced Measurement and Test</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">AMT 2010</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Advanced Measurement and Test X</subfield></datafield><datafield tag="246" ind1="1" ind2="1"><subfield code="a">Advanced Measurement and Test X</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Stafa-Zurich, Switzerland ; Enfield, NH</subfield><subfield code="b">Trans Tech Publications</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (2 volumes (xxi, 1643 pages))</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Key engineering materials</subfield><subfield code="v">v. 439-440</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electric measurements</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronic measurements</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electric measurements</subfield><subfield code="v">Congresses</subfield><subfield code="a">Electronic measurements</subfield><subfield code="v">Congresses</subfield><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wu, Yanwen</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China)</subfield><subfield code="t">Advanced measurement and test</subfield><subfield code="d">Stafa-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, Ltd., 2010</subfield><subfield code="z">9780878492718</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030730788</subfield></datafield></record></collection> |
| id | DE-604.BV045344084 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:30Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030730788 |
| oclc_num | 670535635 |
| open_access_boolean | |
| physical | 1 online resource (2 volumes (xxi, 1643 pages)) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Trans Tech Publications |
| record_format | marc |
| series2 | Key engineering materials |
| spelling | International Conference on Advanced Measurement and Test <2010, Sanya Shi, China> Verfasser aut Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X edited by Yanwen Wu International Conference on Advanced Measurement and Test AMT 2010 Advanced Measurement and Test X Stafa-Zurich, Switzerland ; Enfield, NH Trans Tech Publications 2010 1 online resource (2 volumes (xxi, 1643 pages)) illustrations txt rdacontent c rdamedia cr rdacarrier Key engineering materials v. 439-440 Print version record Electric measurements fast Electronic measurements fast Materials / Testing fast Electric measurements Congresses Electronic measurements Congresses Materials Testing Congresses Wu, Yanwen Sonstige oth Erscheint auch als Druck-Ausgabe International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China) Advanced measurement and test Stafa-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, Ltd., 2010 9780878492718 |
| spellingShingle | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X Electric measurements fast Electronic measurements fast Materials / Testing fast Electric measurements Congresses Electronic measurements Congresses Materials Testing Congresses |
| title | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X |
| title_alt | International Conference on Advanced Measurement and Test AMT 2010 Advanced Measurement and Test X |
| title_auth | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X |
| title_exact_search | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X |
| title_full | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X edited by Yanwen Wu |
| title_fullStr | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X edited by Yanwen Wu |
| title_full_unstemmed | Advanced measurement and test selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X edited by Yanwen Wu |
| title_short | Advanced measurement and test |
| title_sort | advanced measurement and test selected peer reviewed papers from the 2010 international conference on advanced measurement and test amt 2010 may 15 16 2010 sanya p r china advanced measurement and test x |
| title_sub | selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China = Advanced Measurement and Test X |
| topic | Electric measurements fast Electronic measurements fast Materials / Testing fast Electric measurements Congresses Electronic measurements Congresses Materials Testing Congresses |
| topic_facet | Electric measurements Electronic measurements Materials / Testing Electric measurements Congresses Electronic measurements Congresses Materials Testing Congresses |
| work_keys_str_mv | AT internationalconferenceonadvancedmeasurementandtest2010sanyashichina advancedmeasurementandtestselectedpeerreviewedpapersfromthe2010internationalconferenceonadvancedmeasurementandtestamt2010may15162010sanyaprchinaadvancedmeasurementandtestx AT wuyanwen advancedmeasurementandtestselectedpeerreviewedpapersfromthe2010internationalconferenceonadvancedmeasurementandtestamt2010may15162010sanyaprchinaadvancedmeasurementandtestx AT internationalconferenceonadvancedmeasurementandtest2010sanyashichina internationalconferenceonadvancedmeasurementandtest AT wuyanwen internationalconferenceonadvancedmeasurementandtest AT internationalconferenceonadvancedmeasurementandtest2010sanyashichina amt2010 AT wuyanwen amt2010 AT internationalconferenceonadvancedmeasurementandtest2010sanyashichina advancedmeasurementandtestx AT wuyanwen advancedmeasurementandtestx |