Microelectronic failure analysis: desk reference : 2001 supplement
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2001
|
| Schlagworte: |
Electronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Materials
> Defects
> Handbooks, manuals, etc
> Electronic apparatus and appliances
> Testing
> Handbooks, manuals, etc
> Semiconductors
> Defects
> Handbooks, manuals, etc
|
| Beschreibung: | Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 |
| Beschreibung: | 1 online resource (v, 171 pages) illustrations |
| ISBN: | 9781615032655 1615032657 |
Internformat
MARC
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| 245 | 1 | 0 | |a Microelectronic failure analysis |b desk reference : 2001 supplement |c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2001 | |
| 300 | |a 1 online resource (v, 171 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
| 650 | 7 | |a Electronics / Materials / Testing |2 fast | |
| 650 | 7 | |a Microelectronics / Materials / Defects |2 fast | |
| 650 | 7 | |a Microelectronics / Materials / Testing |2 fast | |
| 650 | 7 | |a Semiconductors / Defects |2 fast | |
| 650 | 4 | |a Electronic books | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |t Microelectronic failure analysis |d Materials Park, OH : ASM International, 2001 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030730622 | ||
Datensatz im Suchindex
| _version_ | 1804179163135868928 |
|---|---|
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| building | Verbundindex |
| bvnumber | BV045343918 |
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| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV045343918 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:30Z |
| institution | BVB |
| isbn | 9781615032655 1615032657 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030730622 |
| oclc_num | 647829197 |
| open_access_boolean | |
| physical | 1 online resource (v, 171 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee Materials Park, OH ASM International 2001 1 online resource (v, 171 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe Microelectronic failure analysis Materials Park, OH : ASM International, 2001 |
| spellingShingle | Microelectronic failure analysis desk reference : 2001 supplement TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronic failure analysis desk reference : 2001 supplement |
| title_auth | Microelectronic failure analysis desk reference : 2001 supplement |
| title_exact_search | Microelectronic failure analysis desk reference : 2001 supplement |
| title_full | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_fullStr | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_full_unstemmed | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_short | Microelectronic failure analysis |
| title_sort | microelectronic failure analysis desk reference 2001 supplement |
| title_sub | desk reference : 2001 supplement |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Microelectronics / Materials / Defects Microelectronics / Materials / Testing Semiconductors / Defects Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| work_keys_str_mv | AT electronicdevicefailureanalysissociety microelectronicfailureanalysisdeskreference2001supplement |