ISTFA '97: proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
1997
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| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xix, 346 pages) illustrations |
| ISBN: | 9781615030828 1615030824 9780871706195 0871706199 |
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Datensatz im Suchindex
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| indexdate | 2024-07-10T08:15:29Z |
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| isbn | 9781615030828 1615030824 9780871706195 0871706199 |
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| spelling | International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> Verfasser aut ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis sponsored by ASM International 23rd international symposium for testing and failure analysis Materials Park, OH ASM International 1997 1 online resource (xix, 346 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 Davidson, Grace M. Sonstige oth ASM International Sonstige oth Erscheint auch als Druck-Ausgabe Davison, Grace M. ISTFA '97 : Proceedings of the 23rd International Symposium for Testing and Failure Analysis Materials Park : A S M International, 1997 9780871706195 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis |
| title_alt | 23rd international symposium for testing and failure analysis |
| title_auth | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis |
| title_exact_search | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis |
| title_full | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis sponsored by ASM International |
| title_fullStr | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis sponsored by ASM International |
| title_full_unstemmed | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis sponsored by ASM International |
| title_short | ISTFA '97 |
| title_sort | istfa 97 proceedings of the 23rd international symposium for testing and failure analysis 27 31 october 1997 santa clara convention center santa clara california 23rd international symposium for testing and failure analysis |
| title_sub | proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California = 23rd international symposium for testing and failure analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
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