ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2005
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| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xviii, 524 pages) illustrations |
| ISBN: | 9781615030880 1615030883 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045343861 | ||
| 003 | DE-604 | ||
| 005 | 20240511 | ||
| 006 | a |||| 10||| | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2005 |||| o||u| ||||||eng d | ||
| 020 | |a 9781615030880 |9 978-1-61503-088-0 | ||
| 020 | |a 1615030883 |9 1-61503-088-3 | ||
| 035 | |a (ZDB-4-ENC)ocn646817795 | ||
| 035 | |a (OCoLC)646817795 | ||
| 035 | |a (DE-599)BVBBV045343861 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.3815/48 |2 23 | |
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2005 |b Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2005 | |
| 300 | |a 1 online resource (xviii, 524 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Print version record | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
| 650 | 7 | |a Electronics / Materials / Testing |2 fast | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a ASM International |e Sonstige |0 (DE-588)5013969-1 |4 oth | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |0 (DE-588)6015594-2 |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.) |t ISTFA 2005 |d Materials Park, Ohio : ASM International, 2005 |z 087170823X |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 912 | |a ZDB-4-ENC | ||
Datensatz im Suchindex
| _version_ | 1805066794676781056 |
|---|---|
| adam_text | |
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> |
| author_sort | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> |
| building | Verbundindex |
| bvnumber | BV045343861 |
| classification_rvk | ZN 4040 |
| collection | ZDB-4-ENC |
| ctrlnum | (ZDB-4-ENC)ocn646817795 (OCoLC)646817795 (DE-599)BVBBV045343861 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV045343861</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20240511</controlfield><controlfield tag="006">a |||| 10|||</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2005 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781615030880</subfield><subfield code="9">978-1-61503-088-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1615030883</subfield><subfield code="9">1-61503-088-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn646817795</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)646817795</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045343861</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/48</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2005</subfield><subfield code="b">Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California</subfield><subfield code="c">sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xviii, 524 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronic apparatus and appliances / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronics / Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)5013969-1</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)6015594-2</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.)</subfield><subfield code="t">ISTFA 2005</subfield><subfield code="d">Materials Park, Ohio : ASM International, 2005</subfield><subfield code="z">087170823X</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV045343861 |
| illustrated | Illustrated |
| indexdate | 2024-07-20T03:24:01Z |
| institution | BVB |
| institution_GND | (DE-588)5013969-1 (DE-588)6015594-2 |
| isbn | 9781615030880 1615030883 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030730565 |
| oclc_num | 646817795 |
| open_access_boolean | |
| physical | 1 online resource (xviii, 524 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | ASM International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> Verfasser aut ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International Materials Park, OH ASM International 2005 1 online resource (xviii, 524 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige (DE-588)5013969-1 oth Electronic Device Failure Analysis Society Sonstige (DE-588)6015594-2 oth Erscheint auch als Druck-Ausgabe International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.) ISTFA 2005 Materials Park, Ohio : ASM International, 2005 087170823X 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_auth | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_exact_search | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_full | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_fullStr | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_full_unstemmed | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_short | ISTFA 2005 |
| title_sort | istfa 2005 proceedings of the 31st international symposium for testing and failure analysis november 6 10 2005 mcenery convention center san jose california |
| title_sub | Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis2005sanjosecalif istfa2005proceedingsofthe31stinternationalsymposiumfortestingandfailureanalysisnovember6102005mceneryconventioncentersanjosecalifornia AT asminternational istfa2005proceedingsofthe31stinternationalsymposiumfortestingandfailureanalysisnovember6102005mceneryconventioncentersanjosecalifornia AT electronicdevicefailureanalysissociety istfa2005proceedingsofthe31stinternationalsymposiumfortestingandfailureanalysisnovember6102005mceneryconventioncentersanjosecalifornia |