Microelectronic failure analysis: desk reference : 2002 supplement
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2002
|
| Schlagworte: |
Electronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Materials
> Defects
> Handbooks, manuals, etc
> Electronic apparatus and appliances
> Testing
> Handbooks, manuals, etc
> Semiconductors
> Defects
> Handbooks, manuals, etc
|
| Beschreibung: | Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 |
| Beschreibung: | 1 online resource (vi, 210 pages) illustrations |
| ISBN: | 9781615032648 1615032649 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045343696 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2002 |||| o||u| ||||||eng d | ||
| 020 | |a 9781615032648 |9 978-1-61503-264-8 | ||
| 020 | |a 1615032649 |9 1-61503-264-9 | ||
| 035 | |a (ZDB-4-ENC)ocn609419839 | ||
| 035 | |a (OCoLC)609419839 | ||
| 035 | |a (DE-599)BVBBV045343696 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381 |2 23 | |
| 245 | 1 | 0 | |a Microelectronic failure analysis |b desk reference : 2002 supplement |c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c 2002 | |
| 300 | |a 1 online resource (vi, 210 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
| 650 | 7 | |a Electronics / Materials / Testing |2 fast | |
| 650 | 7 | |a Microelectronics / Materials / Defects |2 fast | |
| 650 | 7 | |a Microelectronics / Materials / Testing |2 fast | |
| 650 | 7 | |a Semiconductors / Defects |2 fast | |
| 650 | 4 | |a Electronic books | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |t Microelectronic failure analysis |d Materials Park, Ohio : ASM International, 2002 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030730400 | ||
Datensatz im Suchindex
| _version_ | 1804179162625212416 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV045343696 |
| collection | ZDB-4-ENC |
| ctrlnum | (ZDB-4-ENC)ocn609419839 (OCoLC)609419839 (DE-599)BVBBV045343696 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02176nmm a2200421zc 4500</leader><controlfield tag="001">BV045343696</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781615032648</subfield><subfield code="9">978-1-61503-264-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1615032649</subfield><subfield code="9">1-61503-264-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn609419839</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)609419839</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045343696</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microelectronic failure analysis</subfield><subfield code="b">desk reference : 2002 supplement</subfield><subfield code="c">prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, Ohio</subfield><subfield code="b">ASM International</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (vi, 210 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Digital</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Microelectronics</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronic apparatus and appliances / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronics / Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microelectronics / Materials / Defects</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microelectronics / Materials / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors / Defects</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic books</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="t">Microelectronic failure analysis</subfield><subfield code="d">Materials Park, Ohio : ASM International, 2002</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030730400</subfield></datafield></record></collection> |
| id | DE-604.BV045343696 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:29Z |
| institution | BVB |
| isbn | 9781615032648 1615032649 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030730400 |
| oclc_num | 609419839 |
| open_access_boolean | |
| physical | 1 online resource (vi, 210 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee Materials Park, Ohio ASM International 2002 1 online resource (vi, 210 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe Microelectronic failure analysis Materials Park, Ohio : ASM International, 2002 |
| spellingShingle | Microelectronic failure analysis desk reference : 2002 supplement TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronic failure analysis desk reference : 2002 supplement |
| title_auth | Microelectronic failure analysis desk reference : 2002 supplement |
| title_exact_search | Microelectronic failure analysis desk reference : 2002 supplement |
| title_full | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_fullStr | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_full_unstemmed | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_short | Microelectronic failure analysis |
| title_sort | microelectronic failure analysis desk reference 2002 supplement |
| title_sub | desk reference : 2002 supplement |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Microelectronics / Materials / Defects fast Microelectronics / Materials / Testing fast Semiconductors / Defects fast Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Microelectronics / Materials / Defects Microelectronics / Materials / Testing Semiconductors / Defects Electronic books Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| work_keys_str_mv | AT electronicdevicefailureanalysissociety microelectronicfailureanalysisdeskreference2002supplement |