Microelectronics failure analysis: desk reference
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2004
|
| Schlagworte: |
Microelectronics
> Materials
> Testing
> Handbooks, manuals, etc
> Microelectronics
> Defects
> Testing
> Handbooks, manuals, etc
> Electronic apparatus and appliances
> Testing
> Handbooks, manuals, etc
> Electronics
> Materials
> Testing
> Handbooks, manuals, etc
> Electronics
> Materials
> Defects
> Handbooks, manuals, etc
|
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xiv, 800 pages) illustrations |
| ISBN: | 9781615032662 1615032665 |
Internformat
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| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV045342891 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:28Z |
| institution | BVB |
| isbn | 9781615032662 1615032665 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030729594 |
| oclc_num | 297826771 |
| open_access_boolean | |
| physical | 1 online resource (xiv, 800 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee Materials Park, Ohio ASM International 2004 1 online resource (xiv, 800 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth ASM International Sonstige oth Erscheint auch als Druck-Ausgabe Microelectronics failure analysis Materials Park, Ohio : ASM International, 2004 |
| spellingShingle | Microelectronics failure analysis desk reference TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_fullStr | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_full_unstemmed | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Defects fast Electronics / Materials / Testing fast Microelectronics / Materials / Testing fast Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Defects Electronics / Materials / Testing Microelectronics / Materials / Testing Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
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