Principles of semiconductor network testing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Butterworth-Heinemann
1995
|
| Schlagworte: | |
| Beschreibung: | Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 |
| Beschreibung: | 1 online resource (xiv, 213 pages) illustrations |
| ISBN: | 9780080539560 0080539564 |
Internformat
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| 100 | 1 | |a Afshar, Amir |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Principles of semiconductor network testing |c Amir Afshar |
| 264 | 1 | |a Boston |b Butterworth-Heinemann |c 1995 | |
| 264 | 4 | |c 1995 | |
| 300 | |a 1 online resource (xiv, 213 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 | ||
| 505 | 8 | |a This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 7 | |a Integrated circuits / Testing |2 fast | |
| 650 | 7 | |a Semiconductors / Testing |2 fast | |
| 650 | 4 | |a Integrated circuits |x Testing |a Semiconductors |x Testing | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Afshar, Amir |t Principles of semiconductor network testing |d Boston : Butterworth-Heinemann, 1995 |z 0750694726 |z 9780750694728 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030728923 | ||
Datensatz im Suchindex
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| any_adam_object | |
| author | Afshar, Amir |
| author_facet | Afshar, Amir |
| author_role | aut |
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| contents | This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources |
| ctrlnum | (ZDB-4-ENC)ocn174141702 (OCoLC)174141702 (DE-599)BVBBV045342221 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV045342221 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:26Z |
| institution | BVB |
| isbn | 9780080539560 0080539564 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030728923 |
| oclc_num | 174141702 |
| open_access_boolean | |
| physical | 1 online resource (xiv, 213 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Butterworth-Heinemann |
| record_format | marc |
| spelling | Afshar, Amir Verfasser aut Principles of semiconductor network testing Amir Afshar Boston Butterworth-Heinemann 1995 1995 1 online resource (xiv, 213 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing Erscheint auch als Druck-Ausgabe Afshar, Amir Principles of semiconductor network testing Boston : Butterworth-Heinemann, 1995 0750694726 9780750694728 |
| spellingShingle | Afshar, Amir Principles of semiconductor network testing This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| title | Principles of semiconductor network testing |
| title_auth | Principles of semiconductor network testing |
| title_exact_search | Principles of semiconductor network testing |
| title_full | Principles of semiconductor network testing Amir Afshar |
| title_fullStr | Principles of semiconductor network testing Amir Afshar |
| title_full_unstemmed | Principles of semiconductor network testing Amir Afshar |
| title_short | Principles of semiconductor network testing |
| title_sort | principles of semiconductor network testing |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Integrated circuits / Testing Semiconductors / Testing Integrated circuits Testing Semiconductors Testing |
| work_keys_str_mv | AT afsharamir principlesofsemiconductornetworktesting |