Thin film materials: stress, defect formation, and surface evolution
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, UK ; New York
Cambridge University Press
2003
|
| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xviii, 750 pages) illustrations |
| ISBN: | 051116372X 9780511163722 0521822815 9780521822817 051116565X 9780511165658 0511164521 9780511164521 0511184123 9780511184123 9780511754715 051175471X 1280437669 9781280437663 |
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| 505 | 8 | |a "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate | |
| 505 | 8 | |a While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Solid State |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Semiconductors |2 bisacsh | |
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| 650 | 7 | |a Thin films |2 fast | |
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Datensatz im Suchindex
| _version_ | 1804179158187638784 |
|---|---|
| any_adam_object | |
| author | Freund, L. B. |
| author_facet | Freund, L. B. |
| author_role | aut |
| author_sort | Freund, L. B. |
| author_variant | l b f lb lbf |
| building | Verbundindex |
| bvnumber | BV045341472 |
| classification_rvk | UP 7500 UP 7550 |
| collection | ZDB-4-ENC |
| contents | "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket |
| ctrlnum | (ZDB-4-ENC)ocm80244620 (OCoLC)80244620 (DE-599)BVBBV045341472 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV045341472 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:25Z |
| institution | BVB |
| isbn | 051116372X 9780511163722 0521822815 9780521822817 051116565X 9780511165658 0511164521 9780511164521 0511184123 9780511184123 9780511754715 051175471X 1280437669 9781280437663 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030728176 |
| oclc_num | 80244620 |
| open_access_boolean | |
| physical | 1 online resource (xviii, 750 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Cambridge University Press |
| record_format | marc |
| spelling | Freund, L. B. Verfasser aut Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh Cambridge, UK ; New York Cambridge University Press 2003 1 online resource (xviii, 750 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Werkstoffkunde (DE-588)4079184-1 s 1\p DE-604 Suresh, S. Sonstige oth Erscheint auch als Druck-Ausgabe Freund, L.B. Thin film materials Cambridge [England] ; New York : Cambridge University Press, 2003 0521822815 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Freund, L. B. Thin film materials stress, defect formation, and surface evolution "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Werkstoffkunde (DE-588)4079184-1 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4079184-1 (DE-588)4136925-7 |
| title | Thin film materials stress, defect formation, and surface evolution |
| title_auth | Thin film materials stress, defect formation, and surface evolution |
| title_exact_search | Thin film materials stress, defect formation, and surface evolution |
| title_full | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_fullStr | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_full_unstemmed | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_short | Thin film materials |
| title_sort | thin film materials stress defect formation and surface evolution |
| title_sub | stress, defect formation, and surface evolution |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Werkstoffkunde (DE-588)4079184-1 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Solid State TECHNOLOGY & ENGINEERING / Electronics / Semiconductors Surfaces (Technology) Thin films Thin films Surfaces (Technology) Werkstoffkunde Dünne Schicht |
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