Verfügbarkeit: Dark count rate of silicon photomultipliers

Dark count rate of silicon photomultipliers: Metrological characterization and suppression

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Bibliographische Detailangaben
1. Verfasser:	Engelmann, Eugen (VerfasserIn)
Format:	Abschlussarbeit Buch
Sprache:	English
Veröffentlicht:	Göttingen Cuvillier Verlag 2018
Ausgabe:	1. Auflage
Schlagworte:	Dunkelstrom Photonenzähler Sekundärelektronenvervielfacher Photonendetektor Siliciumdetektor Silicium Dark count rate SiPM Silicon Photomultiplier Hochschulschrift
Online-Zugang:	Inhaltsverzeichnis
Beschreibung:	180 Seiten
ISBN:	9783736998926 3736998929

Internformat

MARC


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Datensatz im Suchindex

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adam_text	C ONTENTS 1 IN TROD U CTION 1 1.1 SINGLE PHOTON DETECTION......................................................................................... 1 1.2 SILICON PHOTOM ULTIPLIER......................................................................................... 2 1.3 MOTIVATION AND O B JE C TIV E S................................................................................... 4 1.4 ORGANIZATION OF THIS TH E S IS ................................................................................... 6 2 FUNDAM ENTALS 9 2.1 OPERATION PRINCIPLE OF THE S IP M .......................................................................... 9 2.2 IMPACT IONIZATION.................................................................................................. 14 2.3 AVALANCHE MULTIPLICATION AND BREAKDOW N............................................................ 16 2.4 PHOTON DETECTION EFFICIENCY................................................................................... 18 2.5 MECHANISMS RESPONSIBLE FOR DARK P U LSE S ............................................................. 21 2.5.1 DIFFUSION OF CHARGER C A R R IE R S ................................................................... 22 2.5.2 SHOCKLEY-READ-HALL-GENERATION AND TRAP-ASSISTED TUNNELING ................. 24 2.5.3 POOLE-FRENKEL EFFECT................................................................................... 28 2.5.4 BAND-TO-BAND TU N N E LIN G .......................................................................... 29 2.6 HOT CARRIER LUMINESCENCE...................................................................................... 30 2.6.1 MECHANISMS OF LIGHT GENERATION IN AN AVALANCHE BREAKDOW N ................. 31 2.7 PROMPT AND DELAYED OPTICAL CRO SSTALK .................................................................. 35 2.8 AFTERPULSING........................................................................................................... 36 3 D ETERM IN ATION O F STANDARD SIP M PARAM ETERS 39 3.1 EXPERIMENTAL S E TU P ............................................................................................... 39 3.2 SIGNAL PROCESSING AND PULSE D ETEC TIO N ................................................................ 40 3.3 GAIN AND RECOVERY TIM E ......................................................................................... 41 3.4 BREAKDOWN V O LTA G E ................................................................... 43 3.5 PHOTON DETECTION EFFICIENCY................................................................................... 47 3.6 DARK COUNT R A T E ..................................................................................................... 48 3.7 CORRELATED NOISE...................................................................................................... 50 3.8 PROMPT OPTICAL CROSSTALK PROBABILITY.................................................................... 54 3.9 INVESTIGATED S A M P LE S ............................................................................................ 56 4 IDENTIFICATION O F M ECHANISM S R ESP O N SIB LE FOR D ARK P U LSES 61 4.1 EXPERIMENTAL S E TU P ............................................................................................... 61 4.2 CONVENTIONAL M E TH O D ............................................................................................ 63 4.2.1 RESULTS......................................................................................................... 65 4.3 NOVEL M E TH O D ......................................................................................................... 67 4.3.1 FIRST APPROACH ......................................................................................... 67 4.3.2 SECOND A P P RO A C H ...................................................................................... 71 4.3.3 R ESULTS......................................................................................................... 74 4.4 CONCLUSION............................................................................................................... 76 5 SUPPRESSION O F TH E D IFFUSION C URRENT 79 5.1 PRECEDENT CONSIDERATIONS AND EXPERIMENTAL SE TU P .............................................. 79 5.2 IMPACT OF THE SUBSTRATE POTENTIAL ON THE DARK COUNT R A T E ................................ 81 5.2.1 INVESTIGATIONS AT ROOM TE M P ERATU RE........................................................ 81 5.2.2 INVESTIGATIONS AT DIFFERENT TEM PERATURES ................................................. 84 5.3 IMPACT OF THE SUBSTRATE POTENTIAL ON OTHER SIPM P A RA M E TE RS......................... 87 5.4 CONCLUSION............................................................................................................... 91 6 S PATIALLY R ESOLVED D ARK C OUNT R A TE 93 6.1 EXPERIMENTAL S E TU P ............................................................................................... 93 6.2 EXISTENCE OF H O TSP O TS............................................................................................ 95 6.3 HOTSPOT ANALYSIS - ALGORITHM................................................................................ 97 6.3.1 DETERMINATION OF I GIVING AND HOTSPOTS .................................................... 97 6.3.2 COUNTING OF H O TS P O TS ................................................................................... 100 6.4 CORRELATION OF THE LIGHT EMISSION INTENSITY AND THE DARK COUNT R A T E .................... 103 6.5 IMPACT OF THE SUBSTRATE P O TE N TIA L .......................................................................... 106 6.6 SPATIALLY RESOLVED ACTIVATION E N E RG Y ....................................................................... 110 6.7 CONCLUSION.................................................................................................................. 118 7 O PTIM IZATION O F ION IM P LAN TATION P ARAM ETERS 121 7.1 SIMULATION OF IMPLANTATION DEFECTS WITH S R IM .....................................................121 7.2 INCREASE OF THE ION IMPLANTATION EN E RG Y ................................................................. 124 7.3 DECREASE OF THE ION IMPLANTATION D O SE .................................................................... 132 7.4 VARIATION OF THE N-LAYER D E P T H .................................................................................135 7.5 CONCLUSION.................................................................................................................. 137 8 R ADIATION H ARDNESS 141 8.1 IRRADIATION WITH EOCO 7- R A Y S .................................................................................... 141 8.2 IRRADIATION WITH NEUTRONS.......................................................................................... 148 8.3 CONCLUSION.................................................................................................................. 153 9 SUM M ARY AND O UTLOOK 155 B IBLIOGRAPHY 161 LIST O F P U B LICATION S 175 A CKNOW LEDGEM ENTS 178
any_adam_object	1
author	Engelmann, Eugen
author_GND	(DE-588)1172320837
author_facet	Engelmann, Eugen
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bvnumber	BV045314799
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spelling	Engelmann, Eugen Verfasser (DE-588)1172320837 aut Dark count rate of silicon photomultipliers Metrological characterization and suppression Eugen Engelmann 1. Auflage Göttingen Cuvillier Verlag 2018 180 Seiten txt rdacontent n rdamedia nc rdacarrier Dissertation Universität der Bundeswehr München 2018 Dunkelstrom (DE-588)4347168-7 gnd rswk-swf Photonenzähler (DE-588)4482977-2 gnd rswk-swf Sekundärelektronenvervielfacher (DE-588)4180794-7 gnd rswk-swf Photonendetektor (DE-588)4466001-7 gnd rswk-swf Siliciumdetektor (DE-588)4255772-0 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf Dark count rate SiPM Silicon Photomultiplier (DE-588)4113937-9 Hochschulschrift gnd-content Sekundärelektronenvervielfacher (DE-588)4180794-7 s Silicium (DE-588)4077445-4 s Photonenzähler (DE-588)4482977-2 s DE-604 Photonendetektor (DE-588)4466001-7 s Siliciumdetektor (DE-588)4255772-0 s Dunkelstrom (DE-588)4347168-7 s Eric Cuvillier (Firma) (DE-588)1067137041 pbl DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030701743&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis
spellingShingle	Engelmann, Eugen Dark count rate of silicon photomultipliers Metrological characterization and suppression Dunkelstrom (DE-588)4347168-7 gnd Photonenzähler (DE-588)4482977-2 gnd Sekundärelektronenvervielfacher (DE-588)4180794-7 gnd Photonendetektor (DE-588)4466001-7 gnd Siliciumdetektor (DE-588)4255772-0 gnd Silicium (DE-588)4077445-4 gnd
subject_GND	(DE-588)4347168-7 (DE-588)4482977-2 (DE-588)4180794-7 (DE-588)4466001-7 (DE-588)4255772-0 (DE-588)4077445-4 (DE-588)4113937-9
title	Dark count rate of silicon photomultipliers Metrological characterization and suppression
title_auth	Dark count rate of silicon photomultipliers Metrological characterization and suppression
title_exact_search	Dark count rate of silicon photomultipliers Metrological characterization and suppression
title_full	Dark count rate of silicon photomultipliers Metrological characterization and suppression Eugen Engelmann
title_fullStr	Dark count rate of silicon photomultipliers Metrological characterization and suppression Eugen Engelmann
title_full_unstemmed	Dark count rate of silicon photomultipliers Metrological characterization and suppression Eugen Engelmann
title_short	Dark count rate of silicon photomultipliers
title_sort	dark count rate of silicon photomultipliers metrological characterization and suppression
title_sub	Metrological characterization and suppression
topic	Dunkelstrom (DE-588)4347168-7 gnd Photonenzähler (DE-588)4482977-2 gnd Sekundärelektronenvervielfacher (DE-588)4180794-7 gnd Photonendetektor (DE-588)4466001-7 gnd Siliciumdetektor (DE-588)4255772-0 gnd Silicium (DE-588)4077445-4 gnd
topic_facet	Dunkelstrom Photonenzähler Sekundärelektronenvervielfacher Photonendetektor Siliciumdetektor Silicium Hochschulschrift
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030701743&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT engelmanneugen darkcountrateofsiliconphotomultipliersmetrologicalcharacterizationandsuppression AT ericcuvillierfirma darkcountrateofsiliconphotomultipliersmetrologicalcharacterizationandsuppression

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