Test Generation of Crosstalk Delay Faults in VLSI Circuits:
Gespeichert in:
Hauptverfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer Singapore
2019
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Schlagworte: | |
Online-Zugang: | BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBA01 UBY01 Volltext |
Beschreibung: | 1 Online-Ressource (XI, 156 p. 49 illus., 7 illus. in color) |
ISBN: | 9789811324932 |
DOI: | 10.1007/978-981-13-2493-2 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author | Jayanthy, S. Bhuvaneswari, M.C |
author_facet | Jayanthy, S. Bhuvaneswari, M.C |
author_role | aut aut |
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author_variant | s j sj m b mb |
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discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
doi_str_mv | 10.1007/978-981-13-2493-2 |
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illustrated | Not Illustrated |
indexdate | 2024-08-01T13:41:08Z |
institution | BVB |
isbn | 9789811324932 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030627698 |
oclc_num | 1057679183 |
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owner | DE-384 DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
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physical | 1 Online-Ressource (XI, 156 p. 49 illus., 7 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2019_Fremddaten |
publishDate | 2019 |
publishDateSearch | 2019 |
publishDateSort | 2019 |
publisher | Springer Singapore |
record_format | marc |
spellingShingle | Jayanthy, S. Bhuvaneswari, M.C Test Generation of Crosstalk Delay Faults in VLSI Circuits Circuits and Systems Control Structures and Microprogramming Performance and Reliability Logic Design Systems engineering Microprogramming Operating systems (Computers) Logic design |
title | Test Generation of Crosstalk Delay Faults in VLSI Circuits |
title_auth | Test Generation of Crosstalk Delay Faults in VLSI Circuits |
title_exact_search | Test Generation of Crosstalk Delay Faults in VLSI Circuits |
title_full | Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy, M.C. Bhuvaneswari |
title_fullStr | Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy, M.C. Bhuvaneswari |
title_full_unstemmed | Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy, M.C. Bhuvaneswari |
title_short | Test Generation of Crosstalk Delay Faults in VLSI Circuits |
title_sort | test generation of crosstalk delay faults in vlsi circuits |
topic | Circuits and Systems Control Structures and Microprogramming Performance and Reliability Logic Design Systems engineering Microprogramming Operating systems (Computers) Logic design |
topic_facet | Circuits and Systems Control Structures and Microprogramming Performance and Reliability Logic Design Systems engineering Microprogramming Operating systems (Computers) Logic design |
url | https://doi.org/10.1007/978-981-13-2493-2 |
work_keys_str_mv | AT jayanthys testgenerationofcrosstalkdelayfaultsinvlsicircuits AT bhuvaneswarimc testgenerationofcrosstalkdelayfaultsinvlsicircuits |