Introduction to machine learning with applications in information security:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boca Raton
CRC Press, Taylor & Francis Group
[2018]
|
Schriftenreihe: | Chapman & Hall/CRC machine learning & pattern recognition
16 |
Schlagworte: | |
Beschreibung: | Includes bibliographical references (pages 319-337) and index |
Beschreibung: | xvii, 345 pages 25 cm |
ISBN: | 9781138626782 |
Internformat
MARC
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035 | |a (OCoLC)1039076773 | ||
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245 | 1 | 0 | |a Introduction to machine learning with applications in information security |c Mark Stamp, San Jose State University, California |
264 | 1 | |a Boca Raton |b CRC Press, Taylor & Francis Group |c [2018] | |
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650 | 4 | |a Information networks |x Security measures | |
650 | 4 | |a Machine learning | |
999 | |a oai:aleph.bib-bvb.de:BVB01-030621110 |
Datensatz im Suchindex
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any_adam_object | |
author | Stamp, Mark |
author_facet | Stamp, Mark |
author_role | aut |
author_sort | Stamp, Mark |
author_variant | m s ms |
building | Verbundindex |
bvnumber | BV045232760 |
callnumber-first | T - Technology |
callnumber-label | TK5105 |
callnumber-raw | TK5105.59 |
callnumber-search | TK5105.59 |
callnumber-sort | TK 45105.59 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)1039076773 (DE-599)BVBBV045232760 |
dewey-full | 004.6 |
dewey-hundreds | 000 - Computer science, information, general works |
dewey-ones | 004 - Computer science |
dewey-raw | 004.6 |
dewey-search | 004.6 |
dewey-sort | 14.6 |
dewey-tens | 000 - Computer science, information, general works |
discipline | Informatik |
format | Book |
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id | DE-604.BV045232760 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:12:17Z |
institution | BVB |
isbn | 9781138626782 |
language | English |
lccn | 017023471 |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030621110 |
oclc_num | 1039076773 |
open_access_boolean | |
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physical | xvii, 345 pages 25 cm |
publishDate | 2018 |
publishDateSearch | 2018 |
publishDateSort | 2018 |
publisher | CRC Press, Taylor & Francis Group |
record_format | marc |
series2 | Chapman & Hall/CRC machine learning & pattern recognition |
spelling | Stamp, Mark aut Introduction to machine learning with applications in information security Mark Stamp, San Jose State University, California Boca Raton CRC Press, Taylor & Francis Group [2018] xvii, 345 pages 25 cm txt rdacontent n rdamedia nc rdacarrier Chapman & Hall/CRC machine learning & pattern recognition 16 Includes bibliographical references (pages 319-337) and index Information networks Security measures Machine learning |
spellingShingle | Stamp, Mark Introduction to machine learning with applications in information security Information networks Security measures Machine learning |
title | Introduction to machine learning with applications in information security |
title_auth | Introduction to machine learning with applications in information security |
title_exact_search | Introduction to machine learning with applications in information security |
title_full | Introduction to machine learning with applications in information security Mark Stamp, San Jose State University, California |
title_fullStr | Introduction to machine learning with applications in information security Mark Stamp, San Jose State University, California |
title_full_unstemmed | Introduction to machine learning with applications in information security Mark Stamp, San Jose State University, California |
title_short | Introduction to machine learning with applications in information security |
title_sort | introduction to machine learning with applications in information security |
topic | Information networks Security measures Machine learning |
topic_facet | Information networks Security measures Machine learning |
work_keys_str_mv | AT stampmark introductiontomachinelearningwithapplicationsininformationsecurity |