Optical characterization of thin solid films:
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Cham
Springer
[2018]
|
| Series: | Springer series in surface sciences
volume 64 |
| Subjects: | |
| Physical Description: | xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) |
| ISBN: | 9783319753249 |
Staff View
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| 264 | 1 | |a Cham |b Springer |c [2018] | |
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| 650 | 4 | |a Electronic materials | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Materials / Surfaces | |
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| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
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| id | DE-604.BV045201941 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:11:25Z |
| institution | BVB |
| isbn | 9783319753249 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030590895 |
| oclc_num | 1031845515 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in surface sciences |
| series2 | Springer series in surface sciences |
| spelling | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors Cham Springer [2018] © 2018 xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) txt rdacontent n rdamedia nc rdacarrier Springer series in surface sciences volume 64 Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Stenzel, Olaf 1962- (DE-588)112650775 edt Ohlídal, Miloslav edt Erscheint auch als Online-Ausgabe 978-3-319-75325-6 Springer series in surface sciences volume 64 (DE-604)BV041443927 64 |
| spellingShingle | Optical characterization of thin solid films Springer series in surface sciences Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| title | Optical characterization of thin solid films |
| title_auth | Optical characterization of thin solid films |
| title_exact_search | Optical characterization of thin solid films |
| title_full | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_fullStr | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_full_unstemmed | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_short | Optical characterization of thin solid films |
| title_sort | optical characterization of thin solid films |
| topic | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| topic_facet | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| volume_link | (DE-604)BV041443927 |
| work_keys_str_mv | AT stenzelolaf opticalcharacterizationofthinsolidfilms AT ohlidalmiloslav opticalcharacterizationofthinsolidfilms |