Optical characterization of thin solid films:
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2018]
|
| Schriftenreihe: | Springer series in surface sciences
volume 64 |
| Schlagworte: | |
| Beschreibung: | xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) |
| ISBN: | 9783319753249 |
Internformat
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045201941 | ||
| 003 | DE-604 | ||
| 005 | 20190211 | ||
| 007 | t | ||
| 008 | 180920s2018 a||| |||| 00||| eng d | ||
| 020 | |a 9783319753249 |c hbk. |9 978-3-319-75324-9 | ||
| 035 | |a (OCoLC)1031845515 | ||
| 035 | |a (DE-599)BVBBV045201941 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-11 | ||
| 082 | 0 | |a 530.417 |2 23 | |
| 084 | |a UP 7800 |0 (DE-625)146445: |2 rvk | ||
| 245 | 1 | 0 | |a Optical characterization of thin solid films |c Olaf Stenzel, Miloslav Ohlídal, editors |
| 264 | 1 | |a Cham |b Springer |c [2018] | |
| 264 | 4 | |c © 2018 | |
| 300 | |a xxiv, 462 Seiten |b Illustrationen, Diagramme (überwiegend farbig) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Springer series in surface sciences |v volume 64 | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Electronic materials | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Materials / Surfaces | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 700 | 1 | |a Stenzel, Olaf |d 1962- |0 (DE-588)112650775 |4 edt | |
| 700 | 1 | |a Ohlídal, Miloslav |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |z 978-3-319-75325-6 |
| 830 | 0 | |a Springer series in surface sciences |v volume 64 |w (DE-604)BV041443927 |9 64 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030590895 | ||
Datensatz im Suchindex
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| author_GND | (DE-588)112650775 |
| author_facet | Stenzel, Olaf 1962- Ohlídal, Miloslav |
| building | Verbundindex |
| bvnumber | BV045201941 |
| classification_rvk | UP 7800 |
| ctrlnum | (OCoLC)1031845515 (DE-599)BVBBV045201941 |
| dewey-full | 530.417 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.417 |
| dewey-search | 530.417 |
| dewey-sort | 3530.417 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV045201941 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:11:25Z |
| institution | BVB |
| isbn | 9783319753249 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030590895 |
| oclc_num | 1031845515 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in surface sciences |
| series2 | Springer series in surface sciences |
| spelling | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors Cham Springer [2018] © 2018 xxiv, 462 Seiten Illustrationen, Diagramme (überwiegend farbig) txt rdacontent n rdamedia nc rdacarrier Springer series in surface sciences volume 64 Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Stenzel, Olaf 1962- (DE-588)112650775 edt Ohlídal, Miloslav edt Erscheint auch als Online-Ausgabe 978-3-319-75325-6 Springer series in surface sciences volume 64 (DE-604)BV041443927 64 |
| spellingShingle | Optical characterization of thin solid films Springer series in surface sciences Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| title | Optical characterization of thin solid films |
| title_auth | Optical characterization of thin solid films |
| title_exact_search | Optical characterization of thin solid films |
| title_full | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_fullStr | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_full_unstemmed | Optical characterization of thin solid films Olaf Stenzel, Miloslav Ohlídal, editors |
| title_short | Optical characterization of thin solid films |
| title_sort | optical characterization of thin solid films |
| topic | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| topic_facet | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| volume_link | (DE-604)BV041443927 |
| work_keys_str_mv | AT stenzelolaf opticalcharacterizationofthinsolidfilms AT ohlidalmiloslav opticalcharacterizationofthinsolidfilms |