Typical Electron Microscope Investigations:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Macmillan Education UK
1976
|
| Schriftenreihe: | Philips Technical Library
|
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Beschreibung: | 1 Online-Ressource (VIII, 112 p) |
| ISBN: | 9781349026821 |
| DOI: | 10.1007/978-1-349-02682-1 |
Internformat
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Datensatz im Suchindex
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| author | Edington, J. W. |
| author_facet | Edington, J. W. |
| author_role | aut |
| author_sort | Edington, J. W. |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3 |
| dewey-search | 621.3 |
| dewey-sort | 3621.3 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-349-02682-1 |
| format | Electronic eBook |
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| id | DE-604.BV045187458 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:59Z |
| institution | BVB |
| isbn | 9781349026821 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030576636 |
| oclc_num | 1053820045 |
| open_access_boolean | |
| owner | DE-634 |
| owner_facet | DE-634 |
| physical | 1 Online-Ressource (VIII, 112 p) |
| psigel | ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 1976 |
| publishDateSearch | 1976 |
| publishDateSort | 1976 |
| publisher | Macmillan Education UK |
| record_format | marc |
| series2 | Philips Technical Library |
| spelling | Edington, J. W. Verfasser aut Typical Electron Microscope Investigations by J. W. Edington London Macmillan Education UK 1976 1 Online-Ressource (VIII, 112 p) txt rdacontent c rdamedia cr rdacarrier Philips Technical Library Microwaves, RF and Optical Engineering Microwaves Erscheint auch als Druck-Ausgabe 9780333186404 Erscheint auch als Druck-Ausgabe 9781349026838 https://doi.org/10.1007/978-1-349-02682-1 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Edington, J. W. Typical Electron Microscope Investigations Microwaves, RF and Optical Engineering Microwaves |
| title | Typical Electron Microscope Investigations |
| title_auth | Typical Electron Microscope Investigations |
| title_exact_search | Typical Electron Microscope Investigations |
| title_full | Typical Electron Microscope Investigations by J. W. Edington |
| title_fullStr | Typical Electron Microscope Investigations by J. W. Edington |
| title_full_unstemmed | Typical Electron Microscope Investigations by J. W. Edington |
| title_short | Typical Electron Microscope Investigations |
| title_sort | typical electron microscope investigations |
| topic | Microwaves, RF and Optical Engineering Microwaves |
| topic_facet | Microwaves, RF and Optical Engineering Microwaves |
| url | https://doi.org/10.1007/978-1-349-02682-1 |
| work_keys_str_mv | AT edingtonjw typicalelectronmicroscopeinvestigations |