Introduction to IDDQ Testing:
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the obse...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1997
|
| Schriftenreihe: | Frontiers in Electronic Testing
8 |
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Zusammenfassung: | Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area |
| Beschreibung: | 1 Online-Ressource (XIX, 323 p) |
| ISBN: | 9781461561378 |
| DOI: | 10.1007/978-1-4615-6137-8 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV045187306 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:59Z |
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| isbn | 9781461561378 |
| language | English |
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| series2 | Frontiers in Electronic Testing |
| spelling | Chakravarty, Sreejit Verfasser aut Introduction to IDDQ Testing by Sreejit Chakravarty, Paul J. Thadikaran Boston, MA Springer US 1997 1 Online-Ressource (XIX, 323 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 8 Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area Engineering Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Thadikaran, Paul J. aut Erscheint auch als Druck-Ausgabe 9781461378129 https://doi.org/10.1007/978-1-4615-6137-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Chakravarty, Sreejit Thadikaran, Paul J. Introduction to IDDQ Testing Engineering Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering |
| title | Introduction to IDDQ Testing |
| title_auth | Introduction to IDDQ Testing |
| title_exact_search | Introduction to IDDQ Testing |
| title_full | Introduction to IDDQ Testing by Sreejit Chakravarty, Paul J. Thadikaran |
| title_fullStr | Introduction to IDDQ Testing by Sreejit Chakravarty, Paul J. Thadikaran |
| title_full_unstemmed | Introduction to IDDQ Testing by Sreejit Chakravarty, Paul J. Thadikaran |
| title_short | Introduction to IDDQ Testing |
| title_sort | introduction to iddq testing |
| topic | Engineering Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering |
| topic_facet | Engineering Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering |
| url | https://doi.org/10.1007/978-1-4615-6137-8 |
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