Optimal VLSI Architectural Synthesis: Area, Performance and Testability
Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support int...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
1992
|
Schriftenreihe: | The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing
158 |
Schlagworte: | |
Online-Zugang: | BTU01 Volltext |
Zusammenfassung: | Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions |
Beschreibung: | 1 Online-Ressource (XIV, 289 p) |
ISBN: | 9781461540182 |
DOI: | 10.1007/978-1-4615-4018-2 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV045187028 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 180912s1992 |||| o||u| ||||||eng d | ||
020 | |a 9781461540182 |9 978-1-4615-4018-2 | ||
024 | 7 | |a 10.1007/978-1-4615-4018-2 |2 doi | |
035 | |a (ZDB-2-ENG)978-1-4615-4018-2 | ||
035 | |a (OCoLC)1053803724 | ||
035 | |a (DE-599)BVBBV045187028 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-634 | ||
082 | 0 | |a 621.3815 |2 23 | |
100 | 1 | |a Gebotys, Catherine H. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Optimal VLSI Architectural Synthesis |b Area, Performance and Testability |c by Catherine H. Gebotys, Mohamed I. Elmasry |
264 | 1 | |a Boston, MA |b Springer US |c 1992 | |
300 | |a 1 Online-Ressource (XIV, 289 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing |v 158 | |
520 | |a Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electrical Engineering | |
650 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design | |
650 | 4 | |a Engineering | |
650 | 4 | |a Computer-aided engineering | |
650 | 4 | |a Electrical engineering | |
650 | 4 | |a Electronic circuits | |
650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Computerarchitektur |0 (DE-588)4048717-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Layout |g Mikroelektronik |0 (DE-588)4264372-7 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
689 | 0 | 1 | |a Computerarchitektur |0 (DE-588)4048717-9 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
689 | 1 | 0 | |a Layout |g Mikroelektronik |0 (DE-588)4264372-7 |D s |
689 | 1 | |8 2\p |5 DE-604 | |
700 | 1 | |a Elmasry, Mohamed I. |4 aut | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781461367970 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4615-4018-2 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_Archiv | |
999 | |a oai:aleph.bib-bvb.de:BVB01-030576205 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u https://doi.org/10.1007/978-1-4615-4018-2 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804178878683414528 |
---|---|
any_adam_object | |
author | Gebotys, Catherine H. Elmasry, Mohamed I. |
author_facet | Gebotys, Catherine H. Elmasry, Mohamed I. |
author_role | aut aut |
author_sort | Gebotys, Catherine H. |
author_variant | c h g ch chg m i e mi mie |
building | Verbundindex |
bvnumber | BV045187028 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-1-4615-4018-2 (OCoLC)1053803724 (DE-599)BVBBV045187028 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-1-4615-4018-2 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04035nmm a2200601zcb4500</leader><controlfield tag="001">BV045187028</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180912s1992 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781461540182</subfield><subfield code="9">978-1-4615-4018-2</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4615-4018-2</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-1-4615-4018-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1053803724</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045187028</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Gebotys, Catherine H.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optimal VLSI Architectural Synthesis</subfield><subfield code="b">Area, Performance and Testability</subfield><subfield code="c">by Catherine H. Gebotys, Mohamed I. Elmasry</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 289 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing</subfield><subfield code="v">158</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-Aided Engineering (CAD, CAE) and Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-aided engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerarchitektur</subfield><subfield code="0">(DE-588)4048717-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Layout</subfield><subfield code="g">Mikroelektronik</subfield><subfield code="0">(DE-588)4264372-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Computerarchitektur</subfield><subfield code="0">(DE-588)4048717-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Layout</subfield><subfield code="g">Mikroelektronik</subfield><subfield code="0">(DE-588)4264372-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Elmasry, Mohamed I.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781461367970</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4615-4018-2</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_Archiv</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030576205</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4615-4018-2</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV045187028 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:58Z |
institution | BVB |
isbn | 9781461540182 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030576205 |
oclc_num | 1053803724 |
open_access_boolean | |
owner | DE-634 |
owner_facet | DE-634 |
physical | 1 Online-Ressource (XIV, 289 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_Archiv |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Springer US |
record_format | marc |
series2 | The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing |
spelling | Gebotys, Catherine H. Verfasser aut Optimal VLSI Architectural Synthesis Area, Performance and Testability by Catherine H. Gebotys, Mohamed I. Elmasry Boston, MA Springer US 1992 1 Online-Ressource (XIV, 289 p) txt rdacontent c rdamedia cr rdacarrier The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing 158 Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits VLSI (DE-588)4117388-0 gnd rswk-swf Computerarchitektur (DE-588)4048717-9 gnd rswk-swf Layout Mikroelektronik (DE-588)4264372-7 gnd rswk-swf VLSI (DE-588)4117388-0 s Computerarchitektur (DE-588)4048717-9 s 1\p DE-604 Layout Mikroelektronik (DE-588)4264372-7 s 2\p DE-604 Elmasry, Mohamed I. aut Erscheint auch als Druck-Ausgabe 9781461367970 https://doi.org/10.1007/978-1-4615-4018-2 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Gebotys, Catherine H. Elmasry, Mohamed I. Optimal VLSI Architectural Synthesis Area, Performance and Testability Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits VLSI (DE-588)4117388-0 gnd Computerarchitektur (DE-588)4048717-9 gnd Layout Mikroelektronik (DE-588)4264372-7 gnd |
subject_GND | (DE-588)4117388-0 (DE-588)4048717-9 (DE-588)4264372-7 |
title | Optimal VLSI Architectural Synthesis Area, Performance and Testability |
title_auth | Optimal VLSI Architectural Synthesis Area, Performance and Testability |
title_exact_search | Optimal VLSI Architectural Synthesis Area, Performance and Testability |
title_full | Optimal VLSI Architectural Synthesis Area, Performance and Testability by Catherine H. Gebotys, Mohamed I. Elmasry |
title_fullStr | Optimal VLSI Architectural Synthesis Area, Performance and Testability by Catherine H. Gebotys, Mohamed I. Elmasry |
title_full_unstemmed | Optimal VLSI Architectural Synthesis Area, Performance and Testability by Catherine H. Gebotys, Mohamed I. Elmasry |
title_short | Optimal VLSI Architectural Synthesis |
title_sort | optimal vlsi architectural synthesis area performance and testability |
title_sub | Area, Performance and Testability |
topic | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits VLSI (DE-588)4117388-0 gnd Computerarchitektur (DE-588)4048717-9 gnd Layout Mikroelektronik (DE-588)4264372-7 gnd |
topic_facet | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits VLSI Computerarchitektur Layout Mikroelektronik |
url | https://doi.org/10.1007/978-1-4615-4018-2 |
work_keys_str_mv | AT gebotyscatherineh optimalvlsiarchitecturalsynthesisareaperformanceandtestability AT elmasrymohamedi optimalvlsiarchitecturalsynthesisareaperformanceandtestability |