An Artificial Intelligence Approach to Test Generation:
I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to t...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1987
|
| Schriftenreihe: | The Kluwer International Series in Engineering and Computer Science, Knowledge Representation, Learning and Expert Systems
19 |
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Zusammenfassung: | I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu tions by the other members of my reading committee, Mark Horowitz, and Allen Peterson have greatly improved the content and organization of this thesis by forcing me to communicate my ideas more clearly. I am extremely grateful to the other members of the Logic Group at the Heuristic Programming Project for being a sounding board for my ideas, and providing useful comments. In particular, I would like to thank Matt Ginsberg, Vineet Singh, Devika Subramanian, Richard Trietel, Dave Smith, Jock Mackinlay, and Glenn Kramer for their pointed criticisms. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence). I am grateful to Peter Hart, the former head of the AI lab, and his successor Marty Tenenbaum for providing an excellent environment for performing this research |
| Beschreibung: | 1 Online-Ressource (XIV, 194 p) |
| ISBN: | 9781461319795 |
| DOI: | 10.1007/978-1-4613-1979-5 |
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| id | DE-604.BV045186973 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:58Z |
| institution | BVB |
| isbn | 9781461319795 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030576150 |
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| physical | 1 Online-Ressource (XIV, 194 p) |
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| publishDate | 1987 |
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| publisher | Springer US |
| record_format | marc |
| series2 | The Kluwer International Series in Engineering and Computer Science, Knowledge Representation, Learning and Expert Systems |
| spelling | Singh, Narinder Verfasser aut An Artificial Intelligence Approach to Test Generation by Narinder Singh Boston, MA Springer US 1987 1 Online-Ressource (XIV, 194 p) txt rdacontent c rdamedia cr rdacarrier The Kluwer International Series in Engineering and Computer Science, Knowledge Representation, Learning and Expert Systems 19 I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu tions by the other members of my reading committee, Mark Horowitz, and Allen Peterson have greatly improved the content and organization of this thesis by forcing me to communicate my ideas more clearly. I am extremely grateful to the other members of the Logic Group at the Heuristic Programming Project for being a sounding board for my ideas, and providing useful comments. In particular, I would like to thank Matt Ginsberg, Vineet Singh, Devika Subramanian, Richard Trietel, Dave Smith, Jock Mackinlay, and Glenn Kramer for their pointed criticisms. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence). I am grateful to Peter Hart, the former head of the AI lab, and his successor Marty Tenenbaum for providing an excellent environment for performing this research Engineering Circuits and Systems Artificial Intelligence (incl. Robotics) Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Artificial intelligence Computer-aided engineering Electrical engineering Electronic circuits Künstliche Intelligenz (DE-588)4033447-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Testmustergenerierung (DE-588)4234817-1 gnd rswk-swf Expertensystem (DE-588)4113491-6 gnd rswk-swf Künstliche Intelligenz (DE-588)4033447-8 s Testmustergenerierung (DE-588)4234817-1 s 1\p DE-604 VLSI (DE-588)4117388-0 s Expertensystem (DE-588)4113491-6 s 2\p DE-604 Erscheint auch als Druck-Ausgabe 9781461291831 https://doi.org/10.1007/978-1-4613-1979-5 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Singh, Narinder An Artificial Intelligence Approach to Test Generation Engineering Circuits and Systems Artificial Intelligence (incl. Robotics) Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Artificial intelligence Computer-aided engineering Electrical engineering Electronic circuits Künstliche Intelligenz (DE-588)4033447-8 gnd VLSI (DE-588)4117388-0 gnd Testmustergenerierung (DE-588)4234817-1 gnd Expertensystem (DE-588)4113491-6 gnd |
| subject_GND | (DE-588)4033447-8 (DE-588)4117388-0 (DE-588)4234817-1 (DE-588)4113491-6 |
| title | An Artificial Intelligence Approach to Test Generation |
| title_auth | An Artificial Intelligence Approach to Test Generation |
| title_exact_search | An Artificial Intelligence Approach to Test Generation |
| title_full | An Artificial Intelligence Approach to Test Generation by Narinder Singh |
| title_fullStr | An Artificial Intelligence Approach to Test Generation by Narinder Singh |
| title_full_unstemmed | An Artificial Intelligence Approach to Test Generation by Narinder Singh |
| title_short | An Artificial Intelligence Approach to Test Generation |
| title_sort | an artificial intelligence approach to test generation |
| topic | Engineering Circuits and Systems Artificial Intelligence (incl. Robotics) Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Artificial intelligence Computer-aided engineering Electrical engineering Electronic circuits Künstliche Intelligenz (DE-588)4033447-8 gnd VLSI (DE-588)4117388-0 gnd Testmustergenerierung (DE-588)4234817-1 gnd Expertensystem (DE-588)4113491-6 gnd |
| topic_facet | Engineering Circuits and Systems Artificial Intelligence (incl. Robotics) Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Artificial intelligence Computer-aided engineering Electrical engineering Electronic circuits Künstliche Intelligenz VLSI Testmustergenerierung Expertensystem |
| url | https://doi.org/10.1007/978-1-4613-1979-5 |
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