APA (7th ed.) Citation

Nicolaidis, M., Zorian, Y., & Pradan, D. K. (1998). On-Line Testing for VLSI. Springer US. https://doi.org/10.1007/978-1-4757-6069-9

Chicago Style (17th ed.) Citation

Nicolaidis, Michael, Yervan Zorian, and Dhiraj K. Pradan. On-Line Testing for VLSI. Boston, MA: Springer US, 1998. https://doi.org/10.1007/978-1-4757-6069-9.

MLA (9th ed.) Citation

Nicolaidis, Michael, et al. On-Line Testing for VLSI. Springer US, 1998. https://doi.org/10.1007/978-1-4757-6069-9.