On-Line Testing for VLSI:
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be th...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1998
|
| Schriftenreihe: | Frontiers in Electronic Testing
11 |
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Zusammenfassung: | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers |
| Beschreibung: | 1 Online-Ressource (IV, 160 p) |
| ISBN: | 9781475760699 |
| DOI: | 10.1007/978-1-4757-6069-9 |
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| 520 | |a Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers | ||
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| spelling | On-Line Testing for VLSI edited by Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan Boston, MA Springer US 1998 1 Online-Ressource (IV, 160 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 11 Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Test (DE-588)4059549-3 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content 2\p (DE-588)1071861417 Konferenzschrift gnd-content VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s 3\p DE-604 Nicolaidis, Michael edt Zorian, Yervan edt Pradan, Dhiraj K. edt Erscheint auch als Druck-Ausgabe 9781441950338 https://doi.org/10.1007/978-1-4757-6069-9 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | On-Line Testing for VLSI Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Test (DE-588)4059549-3 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4117388-0 (DE-588)4143413-4 (DE-588)1071861417 |
| title | On-Line Testing for VLSI |
| title_auth | On-Line Testing for VLSI |
| title_exact_search | On-Line Testing for VLSI |
| title_full | On-Line Testing for VLSI edited by Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan |
| title_fullStr | On-Line Testing for VLSI edited by Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan |
| title_full_unstemmed | On-Line Testing for VLSI edited by Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan |
| title_short | On-Line Testing for VLSI |
| title_sort | on line testing for vlsi |
| topic | Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Test (DE-588)4059549-3 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Test VLSI Aufsatzsammlung Konferenzschrift |
| url | https://doi.org/10.1007/978-1-4757-6069-9 |
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