Reliability of Electronic Components: A Practical Guide to Electronic Systems Manufacturing
The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component r...
Gespeichert in:
Hauptverfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1999
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Schlagworte: | |
Online-Zugang: | BTU01 Volltext |
Zusammenfassung: | The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries |
Beschreibung: | 1 Online-Ressource (XLI, 509 p) |
ISBN: | 9783642585050 |
DOI: | 10.1007/978-3-642-58505-0 |
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650 | 4 | |a Engineering | |
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Datensatz im Suchindex
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author | Băjenescu, Titu I. Bâzu, Marius I. |
author_facet | Băjenescu, Titu I. Bâzu, Marius I. |
author_role | aut aut |
author_sort | Băjenescu, Titu I. |
author_variant | t i b ti tib m i b mi mib |
building | Verbundindex |
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collection | ZDB-2-ENG |
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dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-3-642-58505-0 |
format | Electronic eBook |
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indexdate | 2024-07-10T08:10:55Z |
institution | BVB |
isbn | 9783642585050 |
language | English |
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physical | 1 Online-Ressource (XLI, 509 p) |
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spelling | Băjenescu, Titu I. Verfasser aut Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing by Titu I. Băjenescu, Marius I. Bâzu Berlin, Heidelberg Springer Berlin Heidelberg 1999 1 Online-Ressource (XLI, 509 p) txt rdacontent c rdamedia cr rdacarrier The objective of this book is to better understand why components fail, addressing the needs of engineers who will apply reliability principles in design, manufacture, testing, and field service. It so contributes to new approaches and the development of electronic and telecommunications component reliability. As a reference source, it summarizes the knowledge on failure modes, degradation and mechanisms, including a survey of accelerated testing, achieving better reliability, total quality topics, screening tests and prediction methods. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography round the benefit offered by the book. The technical level suites to senior and graduate students, as well as to experts and managers in industries Engineering Electronics and Microelectronics, Instrumentation Quality Control, Reliability, Safety and Risk Quality control Reliability Industrial safety Electronics Microelectronics Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Qualitätskontrolle (DE-588)4047968-7 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s Qualitätskontrolle (DE-588)4047968-7 s 1\p DE-604 Bâzu, Marius I. aut Erscheint auch als Druck-Ausgabe 9783642636257 https://doi.org/10.1007/978-3-642-58505-0 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Băjenescu, Titu I. Bâzu, Marius I. Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing Engineering Electronics and Microelectronics, Instrumentation Quality Control, Reliability, Safety and Risk Quality control Reliability Industrial safety Electronics Microelectronics Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Qualitätskontrolle (DE-588)4047968-7 gnd |
subject_GND | (DE-588)4014360-0 (DE-588)4059245-5 (DE-588)4047968-7 |
title | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing |
title_auth | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing |
title_exact_search | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing |
title_full | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing by Titu I. Băjenescu, Marius I. Bâzu |
title_fullStr | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing by Titu I. Băjenescu, Marius I. Bâzu |
title_full_unstemmed | Reliability of Electronic Components A Practical Guide to Electronic Systems Manufacturing by Titu I. Băjenescu, Marius I. Bâzu |
title_short | Reliability of Electronic Components |
title_sort | reliability of electronic components a practical guide to electronic systems manufacturing |
title_sub | A Practical Guide to Electronic Systems Manufacturing |
topic | Engineering Electronics and Microelectronics, Instrumentation Quality Control, Reliability, Safety and Risk Quality control Reliability Industrial safety Electronics Microelectronics Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Qualitätskontrolle (DE-588)4047968-7 gnd |
topic_facet | Engineering Electronics and Microelectronics, Instrumentation Quality Control, Reliability, Safety and Risk Quality control Reliability Industrial safety Electronics Microelectronics Elektronisches Bauelement Zuverlässigkeit Qualitätskontrolle |
url | https://doi.org/10.1007/978-3-642-58505-0 |
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